University of Central Florida Research Foundation, Inc.

Episolar, Inc.

Neelkanth G Dhere

Ramesh G Dhere

Narendra S Shiradkar

Ankur A Kadam

Eric Schneller

A diagnostic device () having layers () corresponding to respective layers () of a given photovoltaic module (). The diagnostic device is provided for testing and monitoring a condition of the given photovoltaic module. The layers of the diagnostic device may be made of respective materials with the same or substantially the same electrical resistance and aging characteristics as the respective layers of the given photovoltaic module under operational conditions. Electrodes (A-C,A-C,A-C) of the diagnostic device are configured to independently measure electrical resistance along at least two different current resistance paths in the diagnostic device corresponding to respectively different current leakage paths (R, R', R-, R, R) of the given photovoltaic module.

Device for measuring leakage current and aging of a photovoltaic module

A method of forming a CIGSS absorber layer includes the steps of providing a metal precursor, and selenizing the metal precursor using diethyl selenium to form a selenized metal precursor layer (CIGSS absorber layer). A high efficiency solar cell includes a CIGSS absorber layer formed by a process including selenizing a metal precursor using diethyl selenium to form the CIGSS absorber layer.

Growing community of inventors

Merritt Island, FL, United States of America

Neelkanth G Dhere