Samsung Electronics Co., Ltd.

Indian Institute of Science Bangalore

Neelesh B Mehta

Chaiman Lim

Ashok Kumar Reddy Chavva

Sripada Kadambar

Shubham Khunteta

Anirudh Reddy Godala

A method is provided. The method includes receiving, by a User Equipment (UE), a plurality of transmit (Tx) beams from a Base Station (BS), on a plurality of receive (Rx) beams. The method includes determining the beam parameters associated with a plurality of Tx and Rx beam pairs changing at a frequency above a first threshold. The method includes deriving a beam selection metric for the plurality of Tx and Rx beam pairs using the associated beam parameters. The method includes identifying a subset of Tx and Rx beam pairs from the plurality of Tx and Rx beam pairs with the beam selection metric above a second threshold. The method includes prioritizing scanning of the identified subset of Tx and Rx beam pairs to select a Tx and Rx beam pair for communication.

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Bengaluru, India

Neelesh B Mehta