The Nielsen Comapny (us), LLC

Neel Parekh

Joshua Ivan Friedman

Tara Zeynep Baris

An example apparatus includes processor circuitry to: access first input data from meters, the meters to monitor media devices associated with a plurality of panelists, the first input data including media source data and panel data; reduce a dimensionality of the first input data to generate second input data of reduced dimensionality relative to the first input data, the dimensionality of the first input data to be reduced based on a prior probability of an audience rating associated with the plurality of panelists and an approximation of a dependency of the audience rating on at least one of the media source data and the panel data; and decode the second input data of reduced dimensionality to output a probability model parameter for a multivariate probability model, the multivariate probability model having dimensions corresponding to the first input data, the multivariate probability model to label census data.

Probabilistic modeling for anonymized data integration and bayesian survey measurement of sparse and weakly-labeled datasets

Example methods, apparatus, systems and articles of manufacture (e.g., physical storage media) to perform probabilistic modeling for anonymized data integration and measurement of sparse and weakly-labeled datasets are disclosed. An apparatus includes a training controller to train a neural network to produce a trained neural network to output model parameters of a probability model, a model evaluator to execute the trained neural network on input data specifying a time of day, a media source, and at least one feature different from the time of day and the media source to determine one or more first model parameters of the probability model, and a ratings metric generator to evaluate the probability model based on input census data to determine a ratings metric corresponding to the time of day, the media source, and the at least one feature, the probability model configured with the one or more first model parameters.

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New York, NY, United States of America

Neel Parekh