Growing community of inventors

Sugar Land, TX, United States of America

Neal L Adair

Average Co-Inventor Count = 4.43

ph-index = 7

The patent ph-index is calculated by counting the number of publications for which an author has been cited by other authors at least that same number of times.

Forward Citations = 104

Neal L AdairTimothy A Chartrand (6 patents)Neal L AdairMarek K Czernuszenko (4 patents)Neal L AdairJose J Sequeira, Jr (4 patents)Neal L AdairKelly G Walker (4 patents)Neal L AdairLucas J Hilliard (4 patents)Neal L AdairAlan R Wild (4 patents)Neal L AdairMax Deffenbaugh (3 patents)Neal L AdairTed Alan Long (2 patents)Neal L AdairChun Huh (2 patents)Neal L AdairJohn Van Wagoner (2 patents)Neal L AdairDavid Hoyal (2 patents)Neal L AdairSriram Doraiswamy (2 patents)Neal L AdairStephen B Wood (2 patents)Neal L AdairTao Sun (1 patent)Neal L AdairDachang Li (1 patent)Neal L AdairYao-Chou Cheng (1 patent)Neal L AdairXiao-Hui Wu (1 patent)Neal L AdairAndrey A Troshko (1 patent)Neal L AdairSergio A Leonardi (1 patent)Neal L AdairDavid P Yale (1 patent)Neal L AdairRobin Gupta (1 patent)Neal L AdairRune Musum (1 patent)Neal L AdairDavid M Chorneyko (1 patent)Neal L AdairJohn W Snedden (1 patent)Neal L AdairEvan P Child (1 patent)Neal L AdairDon J Daniels, Jr (1 patent)Neal L AdairCharlie S Kim (1 patent)Neal L AdairStephen Bart Wood (0 patent)Neal L AdairJose J Sequiera (0 patent)Neal L AdairDavid M Chorneyko (0 patent)Neal L AdairRobin Gupta (0 patent)Neal L AdairJose J Sequiera (0 patent)Neal L AdairNeal L Adair (14 patents)Timothy A ChartrandTimothy A Chartrand (10 patents)Marek K CzernuszenkoMarek K Czernuszenko (9 patents)Jose J Sequeira, JrJose J Sequeira, Jr (9 patents)Kelly G WalkerKelly G Walker (6 patents)Lucas J HilliardLucas J Hilliard (6 patents)Alan R WildAlan R Wild (5 patents)Max DeffenbaughMax Deffenbaugh (44 patents)Ted Alan LongTed Alan Long (33 patents)Chun HuhChun Huh (11 patents)John Van WagonerJohn Van Wagoner (7 patents)David HoyalDavid Hoyal (5 patents)Sriram DoraiswamySriram Doraiswamy (3 patents)Stephen B WoodStephen B Wood (3 patents)Tao SunTao Sun (31 patents)Dachang LiDachang Li (16 patents)Yao-Chou ChengYao-Chou Cheng (15 patents)Xiao-Hui WuXiao-Hui Wu (10 patents)Andrey A TroshkoAndrey A Troshko (8 patents)Sergio A LeonardiSergio A Leonardi (6 patents)David P YaleDavid P Yale (6 patents)Robin GuptaRobin Gupta (5 patents)Rune MusumRune Musum (4 patents)David M ChorneykoDavid M Chorneyko (2 patents)John W SneddenJohn W Snedden (2 patents)Evan P ChildEvan P Child (1 patent)Don J Daniels, JrDon J Daniels, Jr (1 patent)Charlie S KimCharlie S Kim (1 patent)Stephen Bart WoodStephen Bart Wood (0 patent)Jose J SequieraJose J Sequiera (0 patent)David M ChorneykoDavid M Chorneyko (0 patent)Robin GuptaRobin Gupta (0 patent)Jose J SequieraJose J Sequiera (0 patent)
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Inventor’s number of patents
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Strength of working relationships

Company Filing History:

1. Exxonmobil Upstream Research Company (14 from 1,398 patents)


14 patents:

1. 11261725 - Systems and methods for estimating and controlling liquid level using periodic shut-ins

2. 11180985 - Systems and methods for dynamic liquid level monitoring and control

3. 9441474 - Systems and methods for injecting a particulate mixture

4. 9367564 - Dynamic grouping of domain objects via smart groups

5. 9169726 - Method for quantitatively assessing connectivity for well pairs at varying frequencies

6. 9123161 - System and method for summarizing data on an unstructured grid

7. 8727017 - System and method for obtaining data on an unstructured grid

8. 8731872 - System and method for providing data corresponding to physical objects

9. 8731873 - System and method for providing data corresponding to physical objects

10. 8731875 - System and method for providing data corresponding to physical objects

11. 8429671 - Integrated workflow builder for disparate computer programs

12. 8117019 - Method for evaluating sedimentary basin properties by numerical modeling of sedimentation processes

13. 7433784 - Method to determine properties of a sedimentary body from thickness and grain size distribution at a point within the body

14. 6885941 - Method for predicting properties of a sedimentary deposit from a thickness contour of the deposit

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