Intel Corporation

Naveendran Balasingam

Sankaran M Menon

Vasudev Bibikar

Sunghyun Koh

P Reddy Sahajananda

Yuen Tat Lee

Soon Eng Low

Described is an apparatus which comprises: a first voltage regulator (VR) having a reference input node; and a first multiplexer to provide a reference voltage to the reference input node and operable to select one of at least two different reference voltages as the reference voltage.

Apparatus and method to debug a voltage regulator

An apparatus and method for selecting and outputting test patterns and internal signals during various SHBI modes of operation. The apparatus may include multiple input/output (I/O) pins, one or more functional blocks, a Self-Heat Burn-In (SHBI) state machine that is coupled to the I/O pins and the one or more functional blocks, and a logic selector circuitry that is coupled to the SHBI state machine and the one or more functional blocks. The SHBI state machine may provide to the I/O pins with first one or more test patterns during a first SHBI mode of operation, and to provide the one or more functional blocks with second one or more test patterns during a second SHBI mode of operation. The logic selector circuitry is configured to select and output the first one or more test patterns to stress the I/O pins during the first SHBI mode of operation, and to select and output internal signals of the one more functional blocks during the second SHBI mode of operation.

Apparatuses and methods for outputting signals during self-heat burn-in modes of operation

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Austin, TX, United States of America

Naveendran Balasingam