Texas Instruments Corporation

Naveen Ambalametil Narayanan

Prakash Narayanan

Jasbir Singh

Nikita Naresh

Aravinda Acharya

Rakesh Channabasappa Yaraduyathinahalli

Prathyusha Teja Inuganti

A method is provided. In some examples, the method includes reading a first customer identification value from a first memory on a device and reading a second customer identification value from a first field in a certificate. The method also includes determining whether the first customer identification value matches the second customer identification value. In addition, the method includes reading application data from a second field in the certificate in response to determining that the first customer identification value matches the second customer identification value. The method further includes writing the application data to a second memory on the device in response to determining that the first customer identification value matches the second customer identification value.

Customer identification value for electronic devices

A system includes a volatile storage device, a read-only memory (ROM), a memory built-in self-test (BIST) controller and a central processing unit (CPU). The CPU, upon occurrence of a reset event, executes a first instruction from the ROM to cause the CPU to copy a plurality of instructions from a range of addresses in the ROM to the volatile storage device. The CPU also executes a second instruction from the ROM to change a program counter. The CPU further executes the plurality of instructions from the volatile storage device using the program counter. The CPU, when executing the plurality of instructions from the volatile storage device, causes the ROM to enter a test mode and the memory BIST controller to be configured to test the ROM.

Testing read-only memory using memory built-in self-test controller

Growing community of inventors

Bengaluru, India

Naveen Ambalametil Narayanan