The Boeing Company

The Boenig Company

Nathaniel Philip Roman

Lydell L Frasch

Xue Wu Liu

Matthew Mark Thomas

Lucian Woods

James W Brown, Jr

John Joseph Haake

Anthony Carl Roberts

A system includes a robotic arm of a robotic device, an imaging device coupled to the robotic arm, and a processor configured to control movement of the robotic arm to move the imaging device along a preprogrammed measurement path of a transparency while prompting the imaging device to record images of localized portions of the transparency. The processor is configured to determine one or more localized transparency characteristics based on an analysis of the images of the localized portions.

System and method for measuring localized characteristics of a transparency

A dual stripline assembly includes a first stripline, a second stripline, and an intermediate member. The first stripline includes a first center conductor, first outer ground plane, and first inner ground plane. The first center conductor is spaced apart from and interposed between the first outer ground plane and the first inner ground plane. The first stripline extends along a length of the assembly. The second stripline includes a second center conductor, second outer ground plane, and second inner ground plane. The second center conductor is spaced apart from and interposed between the second outer ground plane and the second inner ground plane. The second stripline extends along the length of the assembly. The intermediate member extends along the length of the assembly, and includes the first inner ground plane and the second inner ground plane.

Dual stripline test fixture apparatuses and methods

A probe calibration device that includes a first offset element having a substantially rectangular first aperture. The probe calibration device includes a tuned pass element disposed adjacent to the first offset element. The tuned pass element has a non-rectangular second aperture. The probe calibration device includes a second offset element disposed adjacent to the tuned pass element and on a side opposite the first offset element. The second offset element has a substantially rectangular third aperture. The probe calibration device includes a backing element disposed adjacent to the second offset element. The first offset element, the tuned pass element, the second offset element and the backing element form a cavity.

Probe calibration devices and methods

Growing community of inventors

Ballwin, MO, United States of America

Nathaniel Philip Roman