Northwestern University

Nathan S Matsuda

Oliver Strider Cossairt

Jesse Chang

Christopher Gezon

A system to process images includes a light source configured to emit a first illumination pattern onto one or more first portions of a scene. The system also includes an image sensor configured to capture light reflected from the scene in response to the emitted first illumination pattern. The system also includes an optimizer configured to perform raytracing of the light reflected from the scene. The system further includes a processor operatively coupled to the optimizer. The processor is configured to determine a parameter of a surface of the scene based on the raytracing, cause the light source to emit a second illumination pattern onto one or more second portions of the scene based at least in part on the parameter of the surface, and refine the parameter of the surface of the scene based on additional raytracing performed on reflected light from the second illumination pattern.

Adaptive sampling for structured light scanning

Motion contrast depth scanning is disclosed herein. A disclosed example apparatus includes an illumination source that is to provide at least one of spatial or temporal changes to light emitted from the illumination source to a scene. The example apparatus also includes a motion contrast sensor, where pixels of the motion contrast sensor are to detect changes corresponding to the scene, and where the motion contrast sensor is to report measurements when a pixel change exceeds a threshold. The example apparatus further includes a processor to determine at least one of a reflectance, a depth, or movement of the scene based on the reported measurements by the motion contrast sensor.

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Evanston, IL, United States of America

Nathan S Matsuda