Aetrium, Inc.

Micro Component Technology, Inc.

Advantek, Inc.

Nathan R Smith

Steven E Schmitt

John A Wedel

Michael P Kassner

Andrew P Sabersky

Robert R D'Orazio

Nicholas Littlestone

Michael J Carroll

William J Gibbons

Jack E Abbott

A microchip handling system has a pair of probes with suction cups for handling microchips. An improved microchip holding device is used in lieu of the suction cups to pick up and hold microchips. The microchip holding device has a head accommodating an annular sleeve that retains the microchip in spaced holding relationship relative to a body. The sleeve establishes a large annular space whereby the vacuum force has a large surface area for holding the microchip in engagement with the sleeve.

Probe for handling microchips

A microchip tray handling apparatus has microchip loading and receiving units for supplying microchips to a microchip tester and receiving tested microchips. The units have tables to support stacks of trays containing microchips. Each unit has a tray holding assembly for raising a stack of trays to allow a bottom tray to be moved along the table. Pick, invert and place probes remove micro chips from the trays and place tested microchips back into the trays.

IC tray handling apparatus and method

A microchip tray handling apparatus has microchip loading and receiving units for supplying microchips to a microchip tester and receiving tested microchips. The units have tables to support stacks of trays containing microchips. Each unit has a tray holding assembly for raising a stack of trays to allow a bottom tray to allow a bottom tray to be moved along the table. Pick, invert and place probes remove microchips from the trays and place tested microchips back into the trays.

IC tray handling apparatus

An inertial parts feeding apparatus and method for dispensing parts, such as microchips, onto a moving belt. The feeding apparatus has a housing supporting an elongated tube accommodating the microchips. A guide mounted on the housing aligns the tube with an arm having an impact shoulder and a microchip stop finger. A roller, engageable with the tube, driven by a stepping motor, moves the tube longitudinally into engagement with the shoulder causing a microchip to move out of the end of the tube and into engagement with the stop finger. The arm is released from the microchip during the time that the tube moves back to its initial position to allow the microchip to move with the belt.

Inertial parts feeding apparatus and method

Apparatus (10) for handling devices for testing under varying temperature conditions is disclosed including a mechanical arm (32) pivotally mounted by a bearing (34) to a control portion (16) which is variably vertically positionable relative to a platform portion (14). An insert arm (38) is rotatably mounted within the mechanical arm (32) to reciprocally and rotatably mount a thermal socket (90) for mating with a contactor (126). The socket (90) is mounted to a vacuum cup (48) to allow position alignment as alignment pins (132) are initially slideably received in alignment notches (124) and when no vacuum is applied and is fixed in the aligned position after the application of vacuum. Thermal tubes (74) of probes (50) are reciprocal with the thermal socket (90) to provide thermally conditioned gas/air to the thermal socket (90). The thermal socket (90) provides a swirling action to the thermally conditioned gas/air to exit 360.degree. around a vacuum cup (112) holding the device in the thermal socket (90) for circulating the thermally conditioned gas/air across the top and past the leads of the device. The apparatus (10) monitors and controls the device core temperature by measuring the temperature of the bottom of the device and of a thermally spaced location of a pedestal (144) abutting the bottom of the device and determining the rate of heat flow through a temperature sensing loop.

Apparatus for handling devices under varying temperatures

Apparatus is disclosed for optically detecting the position of an edge of a workpiece (such as an IC lead tip) in a sensing plane, involving the emission of electromagnetic energy from a known source region in the sensing plane such as to cause the edge to create a shadow having a penumbra in the sensing plane. Two detectors determine the amount of energy which reach two known detection regions in the sensing plane and wholly within the penumbra. The amount of energy detected by one detector determines a first curve in the sensing plane on which the edge must lie, and the amount of energy detected by the other determines a second such curve. The intersection of these two curves fully determines the position of the edge in the sensing plane. Preferably, the source region and both detector regions are all essentially line segments oriented parallel to a z-axis, the two detection regions being disposed axially but spaced from each other. Apparatus is also disclosed for determining a profile of edges on one side of the workpiece. Algorithms are disclosed for interrelating measurements taken on four sides of the workpiece, calculating coplanarity of the lead tips, and calculating tweezing coplanarity of the leads. Two calibration methods are also disclosed. Further apparatus is disclosed for rotating a workpiece by 90 degrees, for example, in order to scan leads on different sides of a package, without requiring any physical modifications for workpieces of different sizes.

Non-contact high resolution displacement measurement technique

The invention of the present document comprises apparatus for receiving and automatically feeding dual-in-line package (DIP) transportation and storage tubes (24) to the singulator (76) of an integrated circuit device handler (20) so that devices (22) in the tubes (24) can be introduced at the singulator (76). The tubes (24) are randomly placed in a hopper (66), and conveyed through an aperture (170) formed in a side wall (172) of the hopper (66). An elevator (74) is provided to raise the tubes (24) to a height at which open ends thereof are disposed above the height of the singulator (76). With a tube (24) so raised, a tube inserter (96) pushes the tube (24) into the tube holder (98) of a manipulator (100). The tube holder (98) is, in turn, pivoted to tilt the tube (24) so that devices (22) within the tube (24) are deposited for introduction into the singulator (76 ).

Automatic integrated circuit transportation tube elevating and tilting

An orientation system forms part of a magnetic core handling system using an oscillating feed cup causing magnetic cores to roll across an arcuate surface into a tapered slot and communicate with an index feed wheel. The index feed wheel has 50 slots formed around the edge thereof, each slot being in communication with a vacuum line to engage and hold the edge of the cores with the open center portion being exposed for testing. The index wheel is controlled without bounce through the use of a permanent magnetic stepping motor. The motor is controlled through four series of pulses for different field phases of the motor to control its movement. A single standard split pin probe is used for testing the magnetic cores and the probe does not come in contact with the core. A storage memory system is used to determine whether the core tested previously a plurality of slots from the accept or reject sorter determines the reservoir into which the cores will be collected. A detector is used on the probe drive mechanism to control the position of the index wheel.

Growing community of inventors

Stillwater, MN, United States of America

Nathan R Smith