International Business Machines Corporation

Nathan R Hiltebeitel

Steven William Tomashot

Robert Tamlyn

Randall L Henderson

William R Tonti

Wayne Frederick Ellis

Wagdi William Abadeer

Josef S Watts

Badih El-Kareh

Duane E Galbi

Satish Gupta

Timothy J Ebbers

Todd Williams

Dale E Pontius

Andrew D Bowen

Thomas W Wyckoff

Michael A Aranda

An invention is disclosed which implements bit line redundancy in a memory module, such as a dynamic random access memory (DRAM), in accordance with a block write operation. The block write operation is commonly used in dual port RAMs, sometimes referred to as video random access memories (VRAM). Specifically, a block write operation allows a plurality of bits of data to be written to a plurality of adjacent bit lines defined by a column address. The precise combination of adjacent bit lines selected by the column address is designated by an address mask. The invention provides a memory module with a redundant bit decoder that incorporates an address masking function into the redundant bit decoder during block write operations and also bypasses a masking function during normal read and write operations. This redundant bit decoder allows a single redundant bit line to replace any single defective bit line of the selected group of block write bit lines. It eliminates the need for replacing all the selected bit lines and, thereby, saves silicon area and maximizes the utilization of available redundant bit elements.

Redundancy architecture and method for block write access cycles

A fuse download system for programming decoders for redundancy. Auxiliary fuse banks have sets of fuses that store logic states that (a) select a redundant decoder and (b) indicate the address of a faulty row/column of memory cells. When the chip is first powered up, each set of fuses is accessed and downloaded to program selected redundant decoders. Because the fuse sets can be dynamically assigned to redundant decoders on an any-for-any basis, the fault tolerance of the redundancy system is enhanced.

Flexible redundancy architecture and fuse download scheme

A programmable storage element for redundancy-programing includes a programmable antifuse circuit, which includes a plurality of first resistors and a switching circuit for coupling the first resistors in series in response to a plurality of first control signals and for coupling the first resistors in parallel in response to a plurality of second control signals to permit programing of the first resistors, and a sensing circuit for determining whether or not the first resistors have been programmed. The state of the first resistors is determined by comparing a first voltage drop across the first resistors with a second voltage drop across a second resistor. Each of the first resistors is an unsilicided polysilicon conductor which has an irreversible resistance decrease when a predetermined threshold current is applied for a minimum period of time.

Low voltage programmable storage element

A programmable storage element for redundancy-programming includes a programmable antifuse circuit, which includes a plurality of first resistors and a switching circuit for coupling the first resistors in series in response to a plurality of first control signals and for coupling the first resistors in parallel in response to a plurality of second control signals to permit programming of the first resistors, and a sensing circuit for determining whether or not the first resistors have been programmed. The state of the first resistors is determined by comparing a first voltage drop across the first resistors with a second voltage drop across a second resistor. Each of the first resistors is an unsilicided polysilicon conductor which has an irreversible resistance decrease when a predetermined threshold current is applied for a minimum period of time.

The selection in a dual port memory device of data from a serial access memory register having a lower byte and an upper byte of data is described herein. In one embodiment, the register is partitioned lengthwise into two sections, corresponding to, for example, a frame buffer A and a frame buffer B. On each serial clock cycle, frame buffer A or frame buffer B for each byte of data may be selected from the register. Each of the selected bytes of data are then passed to a serial output port. In another embodiment, the lower byte of data corresponds to, for example, a frame buffer A and the upper byte corresponds to a frame buffer B. Then either the upper byte or lower byte of data is selected to be output on the serial port. In yet a further embodiment, the serial access memory register is partitioned lengthwise into two sections, each section corresponding to, for example, a frame buffer and the bytes of data correspond to another buffer, then either the lower byte or upper byte is selected to be output on the serial port.

SAM data selection on dual-ported DRAM devices

An implementation of a serial access memory register that facilitates the selecting from two alternate frame buffers on a per pixel basis. The frame buffers are each stored in a portion of a row in a single video RAM. Following data transfer to the serial access memory register, data from each of the two frame buffers is available. A double buffer select signal controls the selection of which half of the serial access memory register will put data on the output bus for each serial clock signal. The serial clock increments the address pointers in both halves of the serial access memory port simultaneously.

Video RAM double buffer select control

An implementation of a serial access memory register facility which allows the external selection of the portion of the SAM to be scanned out. A control signal is provided which causes the reloading of serial access memory address counter causing the reloading of serial access memory address counter causing the serial scanning to shift from one to another of the serial access memory registers. The result is an ability to select a stopping point when scanning out of the serial access memory. Thus, the present invention implements the ability in a video random access memory to specify both the starting and ending points of the data to be scanned out of the serial access memory. The preferred embodiment replaces the QSF status pin with a control pin to preserve the packaging configuration of standard VRAMs.

Video ram with external select of active serial access register

A dual-port DRAM in which a single serial latch is shared between two pairs of folded bit lines from two arrays of memory cells. A first set of mux devices selects one of the two pairs of folded bit lines from each of the arrays, and a second set of mux devices selectively couple one of the remaining folded bit line pairs to either the parallel port or the serial latch for access to the serial port. This arrangement greatly decreases the consumption of chip real estate. At the same time, it makes unlimited vertical scrolling possible through the use of a copy mode that can be carried out in two operating cycles, and facilitates masked writing, while at the same time reducing clocking complexity.

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South Burlington, VT, United States of America

Nathan R Hiltebeitel