General Inspection, LLC

Nathan Kujacznski

Greg Nygaard

Dikshant Sharma

Nadaly Marchi

Mike Nygaard

An inspection system configured to scan internal surfaces of manufactured components includes an optical probe, a light source, a conical mirror, and an imaging sensor. The optical probe has a field of view. The light source is spaced apart from the optical probe and is positioned within the field of view of the optical probe. The conical mirror is secured to the light source and is configured to transform light emitted from the light source into a light disc. The light disc is configured to be projected onto the internal surfaces of the manufactured components while scanning the internal surfaces. The imaging sensor is configured to receive reflections of the light disc from the internal surfaces via the optical probe while scanning the internal surfaces.

Inspection system for manufactured components

An inspection station for manufactured components includes a framework and a plurality of cameras. The framework has of a plurality of vertically stacked and spaced apart plates. Each plate defines a central orifice. The central orifices of each plate are aligned along an axis. The manufactured components are configured to freefall through the central orifices defined by the plates. The plurality of cameras is secured to the framework. Each camera is focused toward a region within the framework to capture images of the manufactured components. The plurality of cameras is arranged in an array that extends radially about the axis. At least one of the cameras is positioned at an angle above a horizontal plane that is perpendicular to the axis and intersects the region within the framework. At least one of the cameras is positioned at an angle below the horizontal plane.

An inspection system includes a base, an array of fixtures, and a plurality of sensors or light sources. Each fixture has a first portion rotatably secured to the base and configured to rotate about a yaw axis and a second portion rotatably secured to the first portion and configured to rotate about a pitch axis. Each sensor or light source is secured to one of the fixtures and is configured to direct light at yaw and pitch angles relative to the base.

An inspection system includes a base plate, an array of fixtures, a plurality of light sources, and a drive mechanism. Each fixture has a first portion rotatably secured to the base plate and configured to rotate about a yaw axis and a second portion rotatably secured to the first portion and configured to rotate about a pitch axis. Each light source is secured to one of the fixtures and is configured to direct light at yaw and pitch angles relative to the base plate. The drive mechanism is configured to rotate the first portions of each fixture about each respective yaw axis and to rotate the second portions of each fixture about each respective pitch axis to adjust yaw and pitch angles of each light source, respectively.

Growing community of inventors

Swartz Creek, MI, United States of America

Nathan Kujacznski