Toshiba Memory Corporation

Kioxia Corporation

Nariyuki Fukuda

Takeshi Yamaguchi

Yuichiro Sanuki

Suguru Tahara

Isao Ooigawa

Tsutomu Miyamae

Kazuhito Hosaka

Keitarou Mishima

Koichi Kimura

A semiconductor device of the embodiment includes a plurality of scan chains, a shift clock control circuit, and a shift clock generation circuit. The plurality of scan chains each include a plurality of scan flip-flops. The shift clock control circuit outputs, to each of the plurality of scan chains, a control signal that non-inverts or inverts a scan clock signal. The shift clock generation circuit is provided to each of the plurality of scan flip-flops and generates a non-inverted scan clock signal or an inverted scan clock signal based on the control signal, the non-inverted scan clock signal being obtained by non-inverting the scan clock signal, the inverted scan clock signal being obtained by inverting the scan clock signal.

Semiconductor device and semiconductor device examination method

According to one embodiment, a semiconductor circuit includes a plurality of memories. The memories are connected to one another in series such that an output node of the memory of the first stage is connected to an input node of the memory of the second stage. The semiconductor circuit includes a test circuit that outputs test data to an input node of the memory of the first stage among the plurality of memories, and a comparison circuit that compares data output from an output node of the memory of the final stage among the plurality of memories with expectation value data.

Semiconductor circuit

Growing community of inventors

Yokohama Kanagawa, Japan

Nariyuki Fukuda