Altera Corporation

Naresh U Mehta

Caleb Crome

Tajana Simunic

Matthew C Hendricks

Kyle Bowers

Parmeshwar Roddy Bayappu

Parmeshwar Reddy Bayappu

Kirk R Martinez

Provided is a distributed test system and method for electrical devices that features bifurcated testing and analysis of test results for electrical devices by aggregating test results from multiple testing systems to a centralized server where analysis of test data is undertaken. The system includes a plurality of testing systems, each of which is configured to operate test software to provide electrical stimuli to devices under test (DUTs) and obtain measured metrics indicative of actual operational characteristics (AOCs) of the DUTs. A decision support system (DSS) is selectively placed in data communication with the plurality of testing systems to receive the measured metrics from each of the plurality of testing systems. The DSS is configured to operate on software and compare desired metrics, indicative of desired operational characteristics (DOCs) of each of the DUTs, with the measured metrics and provide a plurality of operational characteristic determinations (OCDs).

Distributed test system and method

A method for managing testing of test material is disclosed. An electronic traveler associated with the test material is identified. The test materials are tested as specified by the electronic traveler. Test results from the tests are recorded onto the electronic traveler.

Method and apparatus for managing testing in a production flow

A method and device for testing and manufacturing integrated circuits such as microprocessors, memories, ASICs, programmable logic, and other types of integrated circuits. A test system is designed to test the relevant integrated circuit. A device under test emulator responds to the test system. If modifications are needed, the test system can be modified, and used to test actual devices.

Method and device for test vector analysis

A system and method for performing complex queries in a database system. The method identifies a single type of entity in the database. A table or set of columns is formed that is used to track which entries meet the various subcriteria in a complex query through entry of binary marker bits. Logical operations may be performed on such marker bits to identify those entities meeting the specified search criteria. Through appropriate search planning, the bits may be 'reused' during the query search. The method may be used in combination with, for example, index searches and other optimized searching techniques.

Growing community of inventors

Santa Clara, CA, United States of America

Naresh U Mehta