International Business Machines Corporation

Nvidia Corporation

Narendra Keshav Rane

Animesh Khare

Umesh Kumar Shukla

Ravi Lakshmipathy

Mukesh Agarwal

Santoshkumar Jinagar

Pradeep K Vanama

A surface cache stores pixel data on behalf of a pixel processing pipeline that is configured to generate screen tiles. The surface cache assigns hint levels to cache lines storing pixel data according to whether that pixel data is likely to be needed again. When the pixel data is needed to process a subsequent tile, the corresponding cache line is assigned a higher hint value. When the pixel data is not needed again, the corresponding cache line is assigned a lower hint value. The surface cache is configured to preferentially evict cache lines having a lower hint value, thereby preserving cache lines that store pixel data needed for future processing. In addition, a fetch controller is configured to throttle the rate at which fetch requests are issued to the surface cache to prevent situations where pixel data needed for future operations becomes prematurely evicted.

Efficient cache management in a tiled architecture

A clock-data recovery doubler circuit for digitally encoded communications signals is provided. A window comparator includes two thresholds. A clock output is created by the window comparator and also used internally as feedback. Based on the clock output, the window comparator circuit collapses the thresholds while sampling input Bipolar return to zero data.

Structure for window comparator circuit for clock data recovery from bipolar RZ data

A method and system for testing a synthesized design of a semiconductor chip. The method includes inputting a macro test Input/Output (I/O) name of the semiconductor chip, along with associated attributes and a netlist, where the netlist is a synthesized design of the semiconductor chip. The method includes tracking the macro test I/O to a chip test I/O. The method further includes detecting mismatches between attributes associated with the macro test I/O and the chip test I/O. Subsequently, reporting any mismatches between the attributes associated with the macro test I/O and the chip test I/O.

Automated isolation of logic and macro blocks in chip design testing

Growing community of inventors

Bengaluru, India

Narendra Keshav Rane