Delphi Technologies IP Limited

Narendra J Mane

Kevin M Gertiser

Kok Wee Yeo

Jack L Glenn

Gregg Nelson Francisco

Soumyajit Routh

Thomas E Pritchett

Gregg N Francisco

A method for assessing a thermal path associated with an integrated circuit includes identifying a heat application mode based on a design type of the integrated circuit. The method also includes measuring a first temperature of at least one thermal sensing device associated with the integrated circuit. The method also includes applying heat to at least a portion of the integrated circuit according to the heat application mode. The method also includes measuring a second temperature of the at least one thermal sensing device. The method also includes determining a difference between the first temperature and the second temperature. The method also includes determining whether a thermal path between the integrated circuit and an associated substrate is sufficient based on a comparison of the difference between the first temperature and the second temperature with a predetermined difference between an initial temperature and a subsequent temperature of the at least one thermal sensing device.

System and method for multi-point thermal path assessment

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Kokomo, IN, United States of America

Narendra J Mane