Rohm Co., Ltd.

Arkray, Inc.

Naoyuki Usagawa

Tatsuro Shimizu

Takahiro Nishiyama

Takashi Esumi

Hideki Tanji

Toshinori Fujiwara

The present disclosure relates to a motor control system including: a motor control device, including a semiconductor integrated circuit having a memory and forming a control loop for a motor so as to control a drive of the motor; and an external debug device, externally connected to the motor control device and accessible to the memory in the motor control device. The external debug device includes a disturbance signal superimposer and a frequency characteristics deriver. The interference signal superimposer generates a disturbance signal for the control loop and superimposes the disturbance signal on a signal generated in the control loop. The frequency characteristics deriver derives frequency characteristics of the control loop based on the signal generated in the control loop by superimposition.

Motor control system

A motor control device includes an energization controller that generates energization control signals of a bridge driver, an ADC that samples and converts analog feedback voltages corresponding to output voltages of the bridge driver into digital feedback signals, and a zero-crossing detector that receives the feedback signals so as to perform zero-crossing detection for determining commutation timing and PWM duty of the energization control signal. Sampling timings of the ADC are switched to one of PWM on period and PWM off period according to the PWM duty. The energization controller PWM drives lower side switches of the bridge driver, and the sampling timings of the ADC are set to the PWM off period. The ADC performs an ADC process of the feedback voltage both in the PWM on period and in the PWM off period, and the zero-crossing detector adopts one of ADC results according to the PWM duty.

Motor control device

The present invention relates to an analyzer () including a photometry mechanism () for photometrically analyzing a reagent pad of an analytical tool to which a sample is applied, and a table () including a placing portion () at which the analytical tool is to be placed. The light emitting surface () or the light incident surface () of the light from the light emitting elements () of the photometry mechanism () is cleaned, with a cleaning tool () placed at the table (). The present invention further provides a cleaning tool () for cleaning the photometry mechanism () of the analyzer ().

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Kyoto, Japan

Naoyuki Usagawa