Kabushiki Kaisha Toshiba

Naoyuki Kawabe

Kimiyoshi Usami

Masahiro Kanazawa

Toshiyuki Furusawa

Masayuki Koizumi

Hidemasa Zama

Daisuke Sonoda

Tetsuaki Utsumi

Takeshi Kitahara

Masaaki Yamada

Katsuhiro Seta

Keiji Omotani

Yukiko Ito

The verification apparatus for a semiconductor integrated circuit verifies a logic equivalence before and after modification to the circuit by replacing a memory with a divisional memory model that agrees with the memory in number of input and output pins and verifying logics at an input and an output thereof.

Verification apparatus for semiconductor integrated circuit, verification method for semiconductor integrated circuit, and program therefor

According to an embodiment, a semiconductor integrated circuit including first and second lower-layer power supply wires extending in a first direction and first and second upper-layer power supply wires extending in a second direction is provided. First and second connection wires between the upper-layer power supply wires and the lower-layer power supply wires are arranged in a same line along the second direction. First and second position converting wires extending from the connection wires are arranged between the first and second connection wires. First and second upper-side vias provided on the position converting wires are arranged in a same line along the first direction.

Power supply wiring structure

A power consumption analyzing apparatus has a clock gating cell detector configured to detect a clock gating cell which is not present in RTL data but present in a gate-level netlist, a test bench description generation unit configured to add a description concerning the clock gating cell, a monitor signal generation unit configured to specify a monitor signal used for power consumption analysis from the RTL data, an RTL simulation unit configured to execute operational simulation of the target circuit, a monitor unit configured to detect a logic of the monitor signal during the execution of the operational simulation, and a power consumption analysis unit configured to analyze power consumption.

Power consumption analyzing apparatus and power consumption analyzing method

An automatic circuit design apparatus includes a setting module configured to set an upper limit electric potential of a virtual ground line in a circuit to be designed, by use of a cell library for low-threshold cells, a cell library for high-threshold cells, and information of the circuit to be designed. A layout generator is configured to generate a layout based on the information, the cell library for low-threshold cells, and the cell library for high-threshold cells.

Automatic circuit design apparatus, method for automatically designing a circuit, and computer program product for executing an application for an automatic circuit design apparatus

A combination circuit is switched between an active state where power is supplied thereto in response to a control signal and an inactive state where power thereto is interrupted. A flip-flop circuit connected to an input terminal of the combination circuit stores an output signal of the combination circuit in response to a clock signal. The combination circuit is set to an operative state by the control signal immediately before the flip-flop circuit operates in response to the clock signal.

Semiconductor integrated circuit with reduced leakage current

A logic circuit design equipment and a logic circuit design method include analyzing input states of all of first cells, respectively, analyzing leakage currents of all of first cells in a case where each first cell is high Vth cell showing a small leakage current at a low speed operation and low Vth cell showing a large leakage current at a high speed operation, respectively, and substituting the first cells for second cells within a range satisfying a timing restriction. Herein, a threshold of the second cell is different from a threshold of the first cell.

Logic circuit design equipment and method for designing logic circuit for reducing leakage current

Semiconductor integrated circuit, logic operation circuit, and flip flop

Semiconductor circuit having a combination circuit being switched between an active and inactive state

A semiconductor integrated circuit has a CPU for executing various processes, at least one hardware module for receiving instructions from the CPU and executing the instructions, and a power management device for controlling the supply of a clock signal to the CPU so as to stop the clock signal to the CPU if the CPU has an idle time to start the next process. The power management device stops the supply of the clock signal to the CPU during a period in which the CPU can sleep, thereby reducing the power consumption of the CPU.

Semiconductor integrated circuit employing power management device and power management method for the semiconductor integrated circuit

An automatic circuit generation methods and apparatus ( ) provide a desired circuit performance by reducing a leakage current during both a standby state and an active state, where cells having only High-Vth and Mt cells having both High-Vth transistors and Low-Vth translators are optimally mixed in a logical circuit. It is thereby possible to suppress efficiently the leakage current, in a design stage, generated according to miniaturization of LSI layout design and also lowering a supply voltage to the LSI.

Growing community of inventors

Kawasaki, Japan

Naoyuki Kawabe