Omron Corporation

Naoya Ochi

Hiroshi Shimizu

Gaku Shiramizu

Yuki Taniyasu

Shintaro Ueno

Hajime Izutani

Toshiyuki Shigehisa

An image measurement system includes a controller, a projector for emitting illumination light in accordance with a radiation pattern, an imaging unit, and a display unit. The controller includes a display control module for displaying on a display unit an image of a field of view captured by the imaging unit in a state in which illumination light is emitted, a receiving module for receiving a setting of a mask area in association with the image displayed on the display unit, the mask area being an area in which the quantity of illumination light should be reduced compared with another area in the field of view, and an updating module for updating the radiation pattern in accordance with the set mask area, based on a correspondence in position between the radiation pattern of the projector and a projection pattern produced in the field of view by the radiation pattern.

Image measurement system and controller

Providing a slave that can precisely measure operating time of an output device that is service information, without having effects on a control system. To Mix slaveconnected to a field network, an actuatorand sensorthat detects completion of operation of the actuator are connected. Having a built-in timer, the Mix slave measures time from when OUT terminal to which the actuator is connected turns ON until IN terminal to which the sensor is connected turns ON, by using the timer. Time thus obtained will be operating time of the output device. Comparison of this operating time with a setting will determine whether or not the actuator normally operates.

Slave unit, node unit, controllers and network system

Growing community of inventors

Yokohama, Japan

Naoya Ochi