Mitutoyo Corporation

Naoya Kikuchi

Takashi Noda

Hiromi Deguchi

Hirokazu Michiwaki

Katsuyuki Ogura

Hiroshi Kamitani

Kenji Ochi

Shinji Takahashi

Shinjiro Sakamoto

A method for nominal scanning measurement includes allowing a user to select a shape of an object to be measured from a geometric shape menu prepared in advance, allowing the user to input, according to the selected geometric shape, a parameter to specify the geometric shape, allowing the user to select a measurement path from a measurement path menu prepared in advance, allowing the user to input, according to the selected measurement path, a parameter to specify the measurement path, calculating, based on the selected geometric shape, the input parameter of the geometric shape, the selected measurement path, and the input parameter of the measurement path, measurement points on a workpiece and a normal line direction at each of measurement points using a calculation formula prepared in advance, and calculating a path for scanning measurement to move while scanning a sequence of the measurement points.

Method for controlling shape measuring apparatus

A controller of a profile measuring instrument includes: an information acquirer that acquires profile information on a profile of a workpiece and a probe command unit that calculates a probe command value for moving the probe by a movement mechanism based on the profile information acquired by the information acquirer. The probe command value is a value for causing a movement of the stylus tip along a lateral face of an imaginary cone that is imaginarily defined in accordance with the profile of the workpiece based on the profile information, the movement of the stylus tip being performed while a distance between a center of the stylus tip and a reference axis passing through a center of a bottom face of the imaginary cone and parallel to the lateral face of the imaginary cone is kept constant.

Profile measuring method and profile measuring instrument

A scanning measurement instrument is capable of simultaneously achieving both higher accuracy and higher speed in autonomous scanning measurement. The instrument includes a path information holding unit for holding information about the path of the center position of a tip of a scanning probe at past tip center positions with respect to the current tip center position during autonomous scanning measurement performed with the scanning probe; a path reference direction setting unit for setting an approximate straight line direction of the path as a path reference direction; a traveling direction setting unit for setting the path reference direction as a traveling direction; a movement control unit for controlling a moving unit such that the scanning probe is moved in the traveling direction; and a normal direction setting unit for setting the normal direction of a measurement surface according to the traveling direction.

Scanning measurement instrument

An optical measuring device includes: a screen having a reference line; a movable stage; an optical system for forming on the screen an optical image of a to-be-measured object placed on the stage; and an edge detecting sensor () for detecting a passage of a measurement edge of the optical image at an arbitrary position on the screen. The optical measuring device further includes: an offset value storage () storing a distance between the reference line and the edge detecting sensor () as an offset value; and a correction data calculator () for correcting measurement data measured with the reference line and the edge detecting sensor () by use of the offset value.

Optical measuring machine

An apparatus for measuring surface texture causes a probe to trace a surface of a workpiece to detect contact between a tip provided on the tip of the probe and the surface of the workpiece and measures surface texture of the workpiece. The apparatus for measuring surface texture includes: a path division unit dividing a path along which the tip is moved into a plurality of sections between the starting point and the ending point of the path; a moving velocity calculation unit calculating a moving velocity of the tip in sequence from the starting point to the ending point for each of the plurality of sections, based on the path information for each of the plurality of sections; and a stylus movement control unit moving the tip in a section for which a moving velocity has been calculated at the moving velocity calculation unit.

Apparatus, method and program for measuring surface texture

A distribution of sample points, which are obtained by a two or three-dimensional coordinate measuring machine, is examined to classify into zero through third degrees. A geometry element is discriminated on the basis of the distribution of the sample points (zero through third degrees) and the number of the sample points. When the number of the sample points is equal to 2 or more and the distribution of the sample points is of the second degree, the geometry element can be discriminated as a plane or a circle in consideration of the probe moving direction. When the number of the sample points is equal to 6 or more, the geometry element can be discriminated as a cylinder or a circular cone on the basis of calculation of a half vertical angle of a circular cone that is specified from the sample points.

Growing community of inventors

Utsunomiya, Japan

Naoya Kikuchi