Shimadzu Corporation

Naoto Mishina

Hiroshi Horikawa

Satoru Sugimoto

Takahide Hatahori

Takashi Tanaka

Hirofumi Okamoto

Masashi Hayakawa

Yatsuse Majima

Yuki Ebara

A defect detection device includes: an excitation unit configured to apply vibration to an inspection object; a vibration state image creation unit configured to measure by an optical means a vibration state in a measurement area on a surface of the inspection object to which the vibration is applied, and to create one or more types of vibration state images representing the vibration state in the measurement area depending on a result of the measurement; an optical image acquisition unit configured to acquire an optical image in the measurement area; an image display unit configured to display an image; and a display control unit configured to perform control to simultaneously display two images among the one or more types of vibration state images and the optical image for the same area in the measurement area on the image display unit.

Defect detection device

A defect inspection apparatus () includes an imager (image sensor) configured to image an inspection target, and a display () configured to display an image based on an image captured by the imager. The defect inspection apparatus () also includes a controller () configured or programmed to receive a setting of a marking () in a predetermined region of interest (S) on the image (still image) displayed on the display (). The controller () is configured or programmed to inspect the inspection target () for a defect based on the image captured by the imager, and superimpose an image of the marking () on a position corresponding to the predetermined region of interest (S) in an image of an inspection result (overlay image) displayed on the display ().

Defect inspection apparatus

A subsea structure detection device includes a plurality of supply electrode pairs each including a positive electrode and a negative electrode, a plurality of potential difference detectors each arranged between the positive electrode and the negative electrode and configured to detect a potential difference between the positive electrode and the negative electrode due to a supplied current, and a controller configured to perform control to determine a position of a structure based on changes in detection signals detected by the plurality of potential difference detectors caused by the structure.

Subsea structure detection device, subsea structure detection system, and subsea structure detection method

Growing community of inventors

Kyoto, Japan

Naoto Mishina