Mitsubishi Denki Kabushiki Kaisha

Naotaka Okada

Shin Sekiya

Zengcheng Tian

Koji Kimura

Masaki Nishimoto

Shigekazu Aoki

Akihiro Shirai

Masayuki Kasamoto

Yukihiro Tsukamoto

Kazuhisa Uetsuki

Masakatsu Murakami

When a special operation mode is instructed, a test oscillation circuit operating at a cycle shorter than a refresh oscillation circuit specifying the cycle of self refresh is activated according to an external row address strobe signal. The internal row address strobe signal is provided to row related control circuitry via a selector. An internal row address strobe signal can be rendered active at a cycle shorter than the cycle of the external row address strobe signal, to carry out row selection. A row is selected at a cycle shorter than the transition cycle of an external signal.

Semiconductor memory device which can be tested while selecting word

Growing community of inventors

Hyogo, Japan

Naotaka Okada