Jfe Steel Corporation

Naoshi Yamahira

Toshiki Tsuboi

Takehide Hirata

Kazuro Tsuda

Toshifumi Kodama

Takahiro Nishino

Yusuke Tanaka

Hidekazu Abe

Yasuyuki Morikawa

Yoshifumi Kobashi

Tsuboi Toshiki

A fine ratio measuring method and apparatus. The fine ratio measuring method includes a step S1 of measuring a distance between a distance measuring device and lumps of material, a step S2 of calculating a feature quantity from distance data obtained in the step S1, and a step S3 of converting the feature quantity calculated in step S2 to a fine ratio. The feature quantity calculated in step S2 represents distance variation calculated from the distance data obtained in the step S1. A higher fine ratio in lumps of material means greater microscopic distance variation caused by microscopic irregularities in the surface of the lumps of material in the height direction within a three-dimensional shape. Therefore, by using the distance variation as the feature quantity, the fine ratio in the lumps of material can be measured in real time with high accuracy.

Fine ratio measuring method and apparatus

A fine ratio measuring device that measures a ratio of fines adhering to the surface of a material in the form of lumps, the fine ratio measuring device includes: an illumination unit that illuminates the material in the form of lumps; a spectrometer that performs spectral analysis on light reflected from the material in the form of lumps to measure spectral reflectance; and an arithmetic device that extracts at least one feature quantity from the spectral reflectance measured by the spectrometer and computes the fine ratio from the extracted at least one feature quantity.

Fine ratio measuring device, fine ratio measuring system, and blast furnace operating method

A fine ratio measuring device that measures the fine ratio of fines adhering to the surface of the material in the form of lumps includes: an illumination unit that illuminates the material in the form of lumps; an imaging unit that captures an image of the material in the form of lumps and produces image data; and an arithmetic unit including a computation unit that computes a characteristic quantity of the image data produced by the imaging unit and a conversion unit that converts the characteristic quantity computed by the computation unit to the fine ratio.

Fine ratio measuring device and fine ratio measuring system

Provided are a raw material particle size distribution measuring apparatus and a particle size distribution measuring method. Also provided is a porosity measuring apparatus. The raw material particle size distribution measuring apparatus includes: a coarse particle measuring device that acquires information indicating the particle size distribution of the coarse particles; a fine particle measuring device that acquires information indicating the particle size distribution of the fine particles; and an arithmetic device that computes the particle size distribution of the coarse particles using the information indicating the particle size distribution of the coarse particles, computes the particle size distribution of the fine particles using the information indicating the particle size distribution of the fine particles, and computes an overall particle size distribution of the raw material using the particle size distribution of the coarse particles and the particle size distribution of the fine particles.

Raw material particle size distribution measuring apparatus, particle size distribution measuring method, and porosity measuring apparatus

A particle size distribution measurement apparatus includes a coarse grain measurement device that acquires information indicating distribution of coarse grains, an adherent powder measurement device that acquires information indicating distribution of adherent powder, and a computation device that calculates distribution of a raw material. The computation device includes a coarse grain particle size distribution calculation unit configured to calculate the distribution of the coarse grains on the basis of the information acquired by the coarse grain measurement device, an adherent powder particle size distribution calculation unit configured to calculate the particle size distribution of the adherent powder on the basis of the information acquired by the adherent powder measurement device, and a raw material particle size distribution calculation unit configured to calculate the particle size distribution of the raw material on the basis of the distribution calculated by the coarse grain and adherent powder particle size distribution calculation units.

Particle size distribution measurement apparatus and particle size distribution measurement method

A method of detecting an abnormality in a blast furnace, wherein the abnormality causes clogging of a tuyere unit of the blast furnace, the method including capturing an image of a raceway unit through an in-furnace monitor window disposed at the tuyere unit; and determining that the abnormality has occurred when a brightness of the captured image is lower than or equal to a predetermined brightness threshold and a rate of decrease in the brightness is lower than or equal to a predetermined brightness-decrease-rate threshold.

Method of detecting abnormality at blast furnace and method of operating blast furnace

An abnormality detection method of detecting abnormality of a blast furnace from tuyere images shot by cameras installed in vicinities of a plurality of tuyeres of the blast furnace includes: collecting, in a time-series manner, representative brightness vectors defined by representative brightnesses determined based on brightness values of respective pixels for each of the tuyeres image previously shot by the cameras at a same time; extracting a principal component vector by performing principal component analysis on the representative brightness vectors collected in the time-series manner; calculating, as an evaluation value, a length of a normal line drawn in a direction of the principal component vector from the representative brightness vector collected from the tuyere images shot by the cameras at the same time during an operation; and detecting the abnormality of the blast furnace by comparing the evaluation value with a predetermined threshold.

Abnormality detection method and blast furnace operation method

An oven wall shape measuring apparatus includes: a slit laser light source that is arranged in a thermally-insulated protection box having a slit-like window and emits slit-like laser light; a laser light mirror that reflects the laser light and irradiates an oven wall surface with the laser light via the window; an imaging mirror that reflects reflected light due to irradiation of the laser light and self-emitting light emitted from the oven wall surface, the reflected light and the self-emitting light entering the thermally-insulated protection box via the window; and an imaging device that images, via an optical filter, the self-emitting light and the reflected light that are reflected from the imaging mirror.

Growing community of inventors

Tokyo, Japan

Naoshi Yamahira