Hitachi, Ltd.

Hitachi-high-technologies Corporation

Hitachi High-technologies Corpoartion

Naoko Ushio

Hiroyuki Yoshimoto

Yayoi Konishi

Ryohei Matsui

Nobuyuki Sugii

Tohru Ando

Hiroki Ohashi

Ryotaro Kawahara

Katsuyuki Nakamura

Masaki Takano

Tetsufumi Kawamura

Hirohiko Sagawa

Mami Konomi

Tsuneya Kurihara

Tsutomu Saito

Masako Nishimura

Shunya Watanabe

Mitsugu Yamashita

Shoutarou Tamayama

Toshinari Ishii

Shingo Kirita

Daiji Iwasa

Motoki Tajima

A pressure sensor device, a method for manufacturing the pressure sensor device, and a work management system mitigating a degree of a false detection is presented. The pressure sensor device detecting pressure includes a flexible substrate base material having flexibility; a comb-teeth shape electrode having an exposed metal surface formed in a predetermined area on the flexible substrate base material; and a pressure-sensitive material that is provided on the comb-teeth shape electrode, varies in a resistance value depending on an amount of a load, and has a curvature in a static state.

Pressure sensor device, method for manufacturing the same, and work management system using the same

Provided is a digitalization system capable of digitalizing the skills of delicate work. This digitalization system comprises a first sensor mounted on a work tool and which detects a deformation of the work tool when the work tool is pressed against a work target, a second sensor which detects a force applied to the work target or a force applied to the work tool when the work tool is pressed against the work target, and a computer which calculates an angle of a corner formed with the work tool and the work target based on sensor values acquired with the first sensor, and calculates a force applied to the work target when the work tool is pressed against the work target based on sensor values acquired with the second sensor.

Delicate work tool digitalization system

To accurately recognize observed objects. An observed-object recognition system includes an observation region estimation portion, an existence region estimation portion, and an object recognition portion. The observation region estimation portion estimates an observation region that is relatively highly likely to be an observation point in at least one first-person image in a first-person video (a video based on the first-person perspective). Based on the observation region, the existence region estimation portion estimates an existence region that belongs to the first-person image and causes an observed object to exist. The object recognition portion recognizes an object in the estimated existence region of the first-person image.

Observed-object recognition system and method

The product inspection system comprises an inspection information collecting unit which collects inspection information acquired from an inspection target, an inspection time acquisition unit which acquires an inspection time that the inspection information was acquired, a recording unit which mutually associates and records the inspection information collected by the inspection information collecting unit and the inspection time acquired by the inspection time acquisition unit, and a display control unit which displays the inspection information recorded in the recording unit on a display terminal.

Product inspection system and production inspection method

Display screen with graphical user interface

The movement distance of a second adjustment slideris made shorter than that of a first adjustment sliderif the first adjustment slideris positioned in a displayed range, except at both ends thereof, of a set value adjustment axisin a first set value adjustment axis display part. The first adjustment slideris kept unmoved while the second adjustment slideralone is moved in the direction of one of both ends of the displayed range if the first adjustment slideris positioned at least at the one of both ends of the displayed range of the set value adjustment axisin the first set value adjustment axis display part, if the second adjustment slideris also positioned in the displayed range except at the both ends thereof, and if the first adjustment slideris to be selectively operated by a cursor. This structure allows coarse and fine adjustments of set values for operation control to be carried out easily and accurately.

Charged particle beam apparatus and program

Growing community of inventors

Tokyo, Japan

Naoko Ushio