Konica Minolta Sensing, Inc.

Naoki Kimura

Jun Matsumoto

Norio Ishikawa

Shinji Yamamoto

Toru Kobayashi

Yutaka Kadowaki

Shu Morikawa

A support apparatus for optical characteristic measurement includes a measurement data inputter configured to input measurement data obtained by an optical characteristic measuring instrument, an image inputter configured to input an image of a measurement object, a measurement table in which the measurement data and the image of the measurement object corresponding to the measurement data are recorded, and a measurement data manager configured to record the measurement data inputted by the measurement data inputter in the measurement table so as to be associated with the image of the measurement object every time an optical characteristic of the measurement object is measured.

Support apparatus for optical characteristic measurement, and program product used for same

A reflected light measuring apparatus including an illumination system and a light receiving system which receives reflected light from a measuring area of an object illuminated with measuring light projected from the illumination system. The illumination system projects the measuring light with a prescribed angular width onto each point in the measuring area. The illumination system and the light receiving system project the measuring light onto the measuring area and receive the reflected light via a telecentric optical system.

Reflected light measuring apparatus and reflected light measuring method

Growing community of inventors

Sakai, Japan

Naoki Kimura