Genesis Technology Inc.

Mitsubishi Materials Corporation

Genesis Technology Incorporation

Naoki Katou

Hideaki Yoshida

Akihiro Masuda

Toshinori Ishii

Tadashi Nakamura

Hayato Sasaki

Akihumi Mishima

Noriyoshi Tachikawa

Shou Tai

Atushi Matsuda

Naohumi Iwamoto

Mituyoshi Ueki

Toshiharu Hiji

Kenji Kubota

Yoshie Tarutani

A terminal material for a connector provided with a base material in which at least a surface layer is made of copper or copper alloy, a nickel-plating layer made of nickel or nickel alloy and formed on a surface of the base material, a silver-nickel alloy plating layer made of silver-nickel alloy and formed on at least a part of the nickel-plating layer, and a silver-plating layer made of silver and formed on the silver-nickel alloy plating layer; the silver-nickel alloy plating layer has a film thickness 0.05 &#xb5;m or more and less than 0.50 &#xb5;m and a nickel content 0.03 at% or more and 1.00 at% or less.

Terminal material for connector

A probe device having a contact probe including a film, a plurality of wiring patterns formed on the film with each wiring pattern having a front end portion projecting from the film so as to form contact pins, and a metal layer provided on the film. In one embodiment, the contact probe device includes first and second contact probes connected to each other, the first contact probe including a first film, and a plurality of first wiring patterns formed on the first film, each first wiring pattern having a front end portion projecting from the first film so as to form contact pins. The second contact probe includes a second film, and a plurality of second wiring patterns formed on the second film. The plurality of second wiring patterns are connected to the plurality of first wiring patterns, and the second contact probe is formed separately from the first contact probe.

Contact probe and probe device

Growing community of inventors

Sanda, Japan

Naoki Katou