Nikon Corporation

Naoki Fukutake

Shinichi Nakajima

Hisao Osawa

Tatsushi Nomura

Shigeru Nakayama

Hiroki Yazawa

Hirohisa Taira

Satoshi Ikeda

A microscope device comprises an illumination optical system for illuminating a sample, a detection optical system for receiving light from the sample, a detector for detecting the light from the sample via the detection optical system and outputting a detection signal of the light, a data processor for generating at least one of a three-dimensional refractive index distribution and a two-dimensional phase distribution in the sample based on the detection signal of the light output from the detector, and a modulation element group that is provided at a position of a pupil or a position conjugate with the pupil in only the illumination optical system, and has light transmittance changing continuously within a surface of the pupil or within a surface conjugate with the pupil.

Microscope device and data generation method using microscope

An observation apparatus in this embodiment includes a light source configured to irradiate an observation target with light, and a processing unit configured to generate an image based on Rayleigh scattered light derived from &#x3c7;included in light obtained from the observation target.

Observation apparatus and observation method

In order to realize a high-speed switching of structured pattern, a structured illuminating microscopy includes a driving unit generating a sonic standing wave in a sonic wave propagation path by giving a driving signal for vibrating a medium of the sonic wave propagation path to a light modulator, an illuminating optical system making at least three diffracted components of the exit light flux passed through the sonic wave propagation path to be interfered with one another, and forming interference fringes on an observational object, an image-forming optical system forming an image by an observational light flux from the observational object on a detector, and a controlling unit controlling a contrast of an image by modulating at least one of an intensity of the exit light flux, an intensity of the observational light flux, and the detector with a modulating signal of 1/N frequency of the driving signal.

Structured illuminating microscopy and structured illuminating observation method

A non-linear microscopy includes an illuminating unit collecting an illuminating light supplied from a light source on a specimen and making a coherent non-linear optical process takes place at a collecting point; a detecting unit detecting a coherent object light occurred in the non-linear optical process and generating a signal indicating light intensity at a light detecting part; and a controlling unit scanning a specimen plane of the specimen by the collecting point and measuring a distribution of the signal on the specimen plane; in which at least one of an optical path of the illuminating light from the light source toward the specimen and an optical path of the object light from the specimen toward the light detecting part is duplicated to a pair of optical paths, and a relationship between the pair of optical paths is set to a symmetric relationship with respect to the specimen plane.

Non-linear microscopy and non-linear observation method

A microscope apparatus includes: a light source; an illumination optical system configured to illuminate a specimen with light from the light source, the illumination optical system having a spatial light modulation element capable of adjusting a light intensity distribution; an imaging optical system configured to image light from the specimen; a solid-state imaging device configured to generate an image of the specimen based on light from the imaging optical system; and a controller capable of adjusting the spatial light modulation element, the controller being configured to, based on a first image output from the solid-state imaging device when the specimen is illuminated with first illumination light, adjust the spatial light modulation element and illuminate the specimen with second illumination light.

Microscope apparatus

A microscope includes an illuminating optical system that illuminates the test object under predetermined illumination conditions, an imaging optical system that forms an image of the test object, and an image sensor that outputs an image signal. A computer includes an image analyzing unit that acquires an image feature amount of the test object on the basis of the image signal detected by the image sensor, a comparison unit that compares the image feature amount of the test object with image feature amounts of a plurality of sample test objects and specifies an image feature amount of a sample test object closest to the image feature amount of the test object, and a setting unit that sets illumination conditions of the illuminating optical system on the basis of an illumination state suitable for observation of a sample test object having the image feature amount specified by the comparison unit.

Microscope system, server, and program providing intensity distribution of illumination light suitable for observation

An imaging apparatus includes an imaging unit that images a test object, an analysis unit that outputs a feature amount of an image which is captured by the imaging unit, a storage unit that stores an evaluation function which has the image feature amount as a variable, for evaluation of the image, a selection unit that selects one image from two or more images including an image specified based on a value of the evaluation function, and a changing unit that changes the evaluation function based on the one image in a case where the one image selected by the selection unit is different from the specified image.

Imaging apparatus and program

A phase-contrast microscope system includes: an illumination optical system that illuminates a specimen with an illumination light from a light source; an imaging optical system that forms an image of the specimen from a light from the specimen; a first spatial modulation element that is disposed in a position of a pupil of the imaging optical system and changes an amplitude transmittance distribution of the light from the specimen; an image sensor that detects the image of the specimen by the imaging optical system and outputs a picture signal; a calculation section that calculates the amplitude transmittance distribution of the light from the specimen appropriate for observing the specimen on the basis of the output data detected by the image sensor and the amplitude transmittance distribution of the light from the specimen formed by the first spatial modulation element.

Microscope system

A structured illumination apparatus includes a light modulator being disposed in a light path of an exit light flux from a light source, and in which a sonic wave propagation path is arranged in a direction traversing the exit light flux; a driving unit generating a sonic standing wave in the sonic wave propagation path by giving a driving signal for vibrating a medium of the sonic wave propagation path to the light modulator; an illuminating optical system making at least three diffracted lights of the exit light flux passed through the sonic wave propagation path to be interfered with one another, and forming interference fringes of the diffracted lights on an observational object; and a controlling unit controlling a contrast of the interference fringes by modulating a phase of at least one diffracted light among the diffracted lights in a predetermined pitch.

Structured illumination apparatus, structured illumination microscopy, and structured illumination method

A microscope which has a high three-dimensional resolution, does not require specimens to be stained and is easy to operate, is presented. The three-dimensional microscope includes a first optical system for illuminating an object with lights in a plurality of illuminating directions, one direction after another; an imaging section; a second optical system for guiding diffracted lights generated by the object and reference lights to the imaging section that obtains interference images of the diffracted lights and the reference lights; and a processor for generating a three-dimensional image using the interference images for respective illuminating directions, obtained by the imaging section. The processor obtains complex amplitudes of the diffracted lights from the interference images for respective illuminating directions and generates the three-dimensional image of the object from the complex amplitudes.

Three-dimensional microscope and method for obtaining three-dimensional image

An achromat-class microscope objective lens, which has a magnification of about 10 times and in which various types of aberration are corrected in peripheral portions of an image, includes a first lens group having a cemented lens composed of a double-concave lens and a double-convex lens, a second lens group having a positive lens, and a third lens group having a cemented lens composed of a double-concave lens and a double-convex lens. The first, second and third lens groups are arranged in that order from an object. The microscope objective lens satisfies certain predetermined expressions.

Microscope objective lens

An inexpensive achromatic object lens for a microscope has a magnification of about 20 and a relatively long working distance. Aberrations are satisfactorily corrected even at the periphery of the image. The object lens includes a first lens group having a positive refractive power, a second lens group having a positive refractive power, and a third lens group having a negative refractive power in this order from the object side. The first lens group consists of a positive lens and a cemented lens which is composed of a negative lens and a positive lens. The second lens group consists of a positive lens for converting the divergent light flux that has exited the first lens group into convergent light flux. The third lens group consists of a negative meniscus lens with its concave surface facing the image side. The object lens satisfies the conditions 4.0.ltoreq.f1/d0.ltoreq.15.0, 55.ltoreq.v2p, and 35.ltoreq.v1p-v1n.

Growing community of inventors

Tokyo, Japan

Naoki Fukutake