Kobe Steel, Ltd.

Kobelco Research Institute, Inc.

Naokazu Sakoda

Eiji Takahashi

Tsutomu Morimoto

Hiroyuki Takamatsu

Masao Murakami

Masato Kannaka

Shiro Horiguchi

Yasuhiro Matsushita

Toshiyuki Tsuji

Toshikatsu Nonaka

Masahiro Inui

Futoshi Ojima

Hajime Takeda

Boundary lines which are contours of uneven marks are detected in a sample original image of the sidewall surface of a sample tire, and a mask image showing the position of the boundary lines is generated. Thereupon, a height offset image which shows a height of the uneven marks is generated by, in use of a plurality of discrete height threshold values, classifying the height of regions in the sample original image which remain after excluding regions corresponding to the positions of the boundary lines shown in the mask image. An unevenness-excluded image is generated by excluding the uneven marks from an inspection image of a sidewall surface of a tire under inspection, by subtracting the height offset image from the inspection image. A shape defect in the sidewall surface of the tire under inspection is inspected on the basis of the unevenness-excluded image.

Device and method for inspecting tyre shape

The present invention provides a crystalline quality evaluation apparatus () and a crystalline quality evaluation method for thin-film semiconductors, which are designed to evaluate crystalline quality of a sample () of a thin-film semiconductor () by emitting excitation light and an electromagnetic wave to irradiate a measurement site of the sample (), and detecting an intensity of a reflected electromagnetic wave from the sample (). In the present invention, the thin-film semiconductor () of the sample () is formed on an electrically conductive film (b), and a dielectric () transparent to the excitation light is additionally disposed between the sample () and a waveguide () for emitting the electromagnetic wave therefrom. Thus, the thin-film semiconductor crystalline quality evaluation apparatus () and method configured in this manner make it possible to evaluate the crystalline quality even in the above situation where the electrically conductive film () is formed under the semiconductor thin-film ().

Crystalline quality evaluation apparatus for thin-film semiconductors, using &#x3bc;-PCD technique

Disclosed is a tire shape inspection method that can reliably and without misidentification perform accurate shape defect inspection in a short period of time by excluding measurement values in a range in which embossed marks are formed from distribution information for surface height measurement values on the sidewall surface of a tire. In the method, a processor automatically detects the positions of the embossed marks based on sample surface shape information obtained from a sample of the tire, and automatically sets coordinate information for a mask range surrounding the area where said marks are present (S-S). The processor also causes a surface shape image based on the sample surface shape information and a mask range image based on the coordinate information for the mask range to be displayed superimposed on a display means, and changes the coordinate information for the mask range according to an operating input (S). The processor also corrects deviation in the coordinate system between the surface height distribution information obtained from the tire undergoing inspection and the coordinate information for the mask range after changing, and excludes measurement values in the mask range from shape defect inspection processing.

Tire shape inspection method and tire shape inspection device

A tire shape measuring system measures a surface shape on the basis of an image of a line of light (a light section line) emitted to a surface of a relatively rotating tire using a light-section method. The shape measuring system includes a light projector for emitting a plurality of lines of light onto a tire surface in directions different from a direction in which the height of the surface is detected so as to form a plurality of separate light section lines and a camera for capturing images of the light section lines in directions in which chief rays of the lines of light are specularly reflected by the tire surface. The shape measuring system individually detects the coordinates of the light section lines from images of pre-defined independent image processing target areas for each captured image and calculates the distribution of the surface height using the detected coordinates.

Tire shape measuring system

A tire shape detecting apparatus includes a projector that applies a plurality line light beams in a continuously joined manner, from a direction different from the detection height direction (Z-axis direction) in one light section line, or that applies one line light beam in a condensed manner in the line length direction thereof in order that the one light section line may be formed on the one line Ls on the surface of the tire; and a camera for picking up images of the plurality of line light beams applied to the tire surface in the direction in which the principal ray of each of the plurality of line light beams performs specular reflection with respect to the tire surface, or in the direction in which the principal ray of the condensed one line light beam performs specular reflection with respect to the tire surface.

Apparatus and method for detecting tire shape

A liquid sample is irradiated with excitation light and measurement light, and a measurement position at which a traveling path of the measurement light passes through an excitation section of the excitation light in the sample is changed while the sample is being irradiated with the excitation light and the measurement light. Then, the phase change of the measurement light is measured for each measurement by optical interferometry on the basis of the measurement light after the measurement light passes through the sample. The measurement position is changed by, for example, scanning the excitation light, moving the sample, moving a lens that collects the excitation light in the sample so as to change the light-collecting position (focal position) in the sample, etc.

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Kobe, Japan

Naokazu Sakoda