Panasonic Intellectual Property Management Co., Ltd.

Onkyo Corporation

Naofumi Shimasaki

Kazutaka Ikeda

Mamoru Sekiya

Tsuyoshi Kawaguchi

Norimasa Kitagawa

Yu Takehara

Kenta Kamizono

A diagnostic system includes an acquirer configured to acquire current waveform data representing a waveform relating to a current supplied to a driving device of an apparatus and a determiner configured to determine a degree of abnormality in the apparatus from a varying portion of the waveform, the varying portion corresponding to a varying time period during which a rotation speed of the driving device increases or decreases.

Diagnostic system, diagnosing method, and program

A determiner which learns acceleration measurement data which has been obtained by an accelerated aging test and indicates that a facility changes from a normal state to an aged state, and advance label data which is obtained by giving a label to data indicating characteristics of aging in the acceleration measurement data. Measurement data of aging diagnosis is obtained from the facility which is operating, teacher aging degree label data is found from a record of maintenance of the facility, and additional data is obtained from the measurement data and the teacher aging degree label data. When a difference between predicted aging degree label data and teacher aging degree label data is greater than a predetermined value, learning data is selected as additional learning data. The additional learning data is learned to update the determiner.

Additional learning method for deterioration diagnosis system

An amplifying circuit comprises: a first transistor, a second transistor, a third transistor and a fourth transistor provided to an input stage; and a first bias circuit. The input signal is input into a control terminal of the first transistor and a control terminal of the second transistor, a first terminal of the first transistor is connected to a first terminal of the third transistor, a first terminal of the second transistor is connected to a first terminal of the fourth transistor, a second terminal of the first transistor is connected to a first potential, a second terminal of the second transistor is connected to a second potential that is equal to or different from the first potential, a second terminal of the third transistor is connected to a third potential, a second terminal of the fourth transistor is connected to a fourth potential, the first bias circuit is connected between a control terminal of the third transistor and a control terminal of the fourth transistor.

Amplifying circuit and current-voltage conversion circuit

Growing community of inventors

Osaka, Japan

Naofumi Shimasaki