Growing community of inventors

Tokyo, Japan

Naoaki Sugimura

Average Co-Inventor Count = 1.15

ph-index = 5

The patent ph-index is calculated by counting the number of publications for which an author has been cited by other authors at least that same number of times.

Forward Citations = 185

Naoaki SugimuraTakaaki Izawa (2 patents)Naoaki SugimuraMasaru Sekiguchi (2 patents)Naoaki SugimuraDanya Sugai (2 patents)Naoaki SugimuraHidekazu Kikuchi (1 patent)Naoaki SugimuraHisao Ohtake (1 patent)Naoaki SugimuraTakeshi Wakamatsu (1 patent)Naoaki SugimuraKouji Morita (1 patent)Naoaki SugimuraNaoaki Sugimura (33 patents)Takaaki IzawaTakaaki Izawa (14 patents)Masaru SekiguchiMasaru Sekiguchi (5 patents)Danya SugaiDanya Sugai (5 patents)Hidekazu KikuchiHidekazu Kikuchi (81 patents)Hisao OhtakeHisao Ohtake (7 patents)Takeshi WakamatsuTakeshi Wakamatsu (5 patents)Kouji MoritaKouji Morita (2 patents)
..
Inventor’s number of patents
..
Strength of working relationships

Company Filing History:

1. Lapis Semiconductor Co., Ltd. (18 from 702 patents)

2. Oki Electric Industry Co., Ltd. (11 from 4,980 patents)

3. Oki Semiconductor Co., Ltd. (4 from 707 patents)

4. Yazaki Corporation (1 from 8,218 patents)


33 patents:

1. 12055598 - Battery monitoring system and semiconductor device

2. 11719756 - Battery monitoring system and semiconductor device

3. 11073569 - Battery monitoring system and semiconductor device

4. 10930981 - Semiconductor device and battery monitoring system

5. 10705148 - Semiconductor device and battery monitoring system

6. 10693301 - Semiconductor device and battery voltage measuring method that prevents measurement error caused by parametric capacitance

7. 10502795 - Battery monitoring system and semiconductor device

8. 10401434 - Semiconductor device, battery monitoring device, and voltage detection method of battery cell

9. 10330736 - Semiconductor device, battery monitoring system, and diagnostic method for semiconductor device

10. 10247785 - Assembled-battery system, semiconductor circuit, and diagnostic method

11. 9966768 - Semiconductor device and battery voltage measuring method that prevents measurement error caused by parametric capacitance

12. 9857432 - Battery monitoring system, semiconductor circuit, line-breakage detection program, and line-breakage detection method

13. 9575129 - Battery monitoring system and semiconductor device

14. 9520775 - Boosting system, diagnosing method, and computer readable medium storing diagnosing program for diagnosing the boosting functions of a boosting section

15. 9160177 - Semiconductor circuit, battery monitoring system, and control method

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