Ablic Inc.

Sii Semiconductor Corporation

Seiko Instrumentals Inc.

Nao Otsuka

Atsushi Igarashi

Masakazu Sugiura

Tsutomu Tomioka

Kosuke Takada

Hideyuki Sawai

Daisuke Okano

Yasuhiro Miyamoto

A current generation circuit includes: a current source circuit including a first transistor and a first resistor, and configured to output a first current based on a source voltage or a drain voltage of the first transistor and a resistance of the first resistor; a current control circuit including a voltage input terminal, a second transistor and a third transistor, and configured to output a second current based on a source voltage of the second transistor and a resistance of the third transistor; and an impedance circuit including a second resistor formed of a same resistive body as the first resistor and a fourth transistor diode-connected to the second resistor, and configured to generate a control voltage at the voltage input terminal by the first current and the second current, wherein the current generation circuit is configured to output a current based on the second current.

Current generation circuit

A secondary battery monitoring device is equipped with a resistance circuit and a detection circuit detecting an abnormality of a secondary battery, a current generation circuit generating a failure detection circuit for setting an output terminal of the resistance circuit to a failure diagnosis voltage, and a switch which permits the failure detection circuit to flow to the output terminal of the resistance circuit by switching. Further, a method for diagnosing failure of the secondary battery monitoring device is provided.

Secondary battery monitoring device and method for diagnosing failure

Provided is an overheat detection circuit configured to accurately detect a temperature of a semiconductor device even at high temperature and thus avoid outputting an erroneous detection result. The overheat detection circuit includes: a PN junction element, being a temperature sensitive element; a constant current circuit configured to supply the PN junction element with a bias current; a comparator configured to compare a voltage generated at the PN junction element and a reference voltage; a second PN junction element configured to cause a leakage current to flow through a reference voltage circuit at high temperature; and a third PN junction element configured to bypass a leakage current of the constant current circuit at the high temperature.

Overheat detection circuit and semiconductor device

To provide a current detection circuit capable of suppressing the occurrence of a large potential difference between input terminals of a differential amplifier circuit, and preventing degradation of input transistors. A differential amplifier circuit is equipped with a clamp circuit which limits gate-source voltages of a pair of PMOS transistors each having a bulk and a source connected to each other with the sources of the pair of PMOS transistors as input terminals.

Current detection circuit

Provided is a power supply voltage monitoring circuit capable of accurately detecting a power supply voltage with a small circuit scale and low power consumption. The power supply voltage monitoring circuit includes: a signal output circuit configured to output a signal voltage representing saturation characteristics with respect to an increase in power supply voltage; and a signal voltage monitoring circuit configured to output a signal representing that the signal voltage of the signal output circuit is normal, the signal voltage monitoring circuit including: a PMOS transistor including a gate connected to an output terminal of the signal output circuit; a first constant current circuit connected to a drain of the PMOS transistor; and an inverter including an input terminal connected to the drain of the PMOS transistor.

Power supply voltage monitoring circuit, and electronic circuit including the power supply voltage monitoring circuit

Provided is a voltage reference circuit which is able to obtain high PSRR without a variation in power-supply voltage and an influence of noise. A voltage reference circuit for performing voltage-current conversion on forward voltages of PN junction elements and on a difference therebetween to generate a voltage so as not to depend on a temperature is constituted by an amplifier for controlling a temperature characteristic of a voltage of an output terminal, a source follower circuit for supplying a power to the amplifier, and a PMOS transistor which is controlled by the amplifier and which controls a current to flow into the PN junction elements.

Growing community of inventors

Chiba, Japan

Nao Otsuka