Synopsys, Inc.

Atrenta, Inc.

Namit Gupta

Mahantesh D Narwade

Rajarshi Mukherjee

Kaushik De

Mohammad Homayoun Movahed-Ezazi

Paras Mal Jain

Maher Mneimneh

Shaker Sarwary

Ashish Bansal

Mohamed Shaker Sarwary

Dipti Ranjan Senapati

Deep Shah

Horia A Toma

Jean-Marc Albert Forey

Suman Nandan

Subhamoy Pal

Information from a circuit design's unified power format (UPF) description is utilized to automate the management of reset domain crossings (RDCs). The UPF description is utilized to identify signals that generate both RDC and power domain crossings (PDCs), thereby allowing a circuit designer to efficiently utilize a common (shared) isolation circuit that functions to manage both the RDC (i.e., during reset functions) and the PDC (i.e., during power management functions). A modified UPF description is introduced that facilitates automated management of RDC issues by treating the reset domains as pseudo-power domains, and utilizing UPF analysis and verification tools to automatically generate both shared and non-shared resources for both RDC and PDC issues.

Reset domain crossing management using unified power format

Methods and apparatuses related to clock-domain-crossing (CDC) specific design mutations to model silicon behavior and measure verification robustness are described. CDC signal paths can be identified in a circuit design. Next, synchronization circuitry associated with the CDC signal paths can be identified. Design mutations can be added to the identified synchronization circuitry. The design mutations can then be used during functional verification to measure verification robustness of a circuit verification test suite.

Clock-domain-crossing specific design mutations to model silicon behavior and measure verification robustness

A method for controlling the functional output of a verification tool upon receipt of a circuit description comprises searching for a predetermined base pattern in the circuit description. The method further comprises searching for predetermined sub-patterns that are assigned to the base pattern, in the circuit description. The method further comprises the validation of each found sub-pattern based on a predetermined rule to minimize the set of reported errors that based on verification of the circuit description.

Verification of circuit structures including sub-structure variants

Systems and techniques for detecting design problems in a circuit design are described. A higher-level abstraction of the circuit design can be synthesized to obtain a lower-level abstraction of the circuit design, and a mapping between signals in the higher-level abstraction and the signals in the lower-level abstraction. A design problem can be detected in the circuit design in response to determining that a possible glitch in a signal in the lower-level abstraction is not blocked when an enable signal is assigned a blocking value. The enable signal and the corresponding blocking value are identified by analyzing the higher-level abstraction.

Accurate glitch detection

A method for functional verification of a circuit description comprises generating a first set of crossover paths based on the circuit description, generating a low power information based on a power design description associated with the circuit description, the low power information determining a set of power state combinations, and generating a second set of crossover paths based on the first set of crossover paths and the low power information, the second set of crossover paths being a subset of the first set of crossover paths. Each of the second set of crossover paths is evaluated to identify circuit description errors, in particular functional circuit description errors.

Minimizing crossover paths for functional verification of a circuit description

A system and methods for metastability verification of an integrated circuit design are provided. An IC design is received and the source-to-destination paths of the IC design are determined. For each of the determined source-to-destination paths, it is determined whether the corresponding source is synchronized. For each source its respective synchronized or unsynchronized result is stored and a report is generated for each source describing whether it is synchronized or unsynchronized. The system may be at least a portion of a computer aided design (CAD) system.

System and method for metastability verification of circuits of an integrated circuit

A method and system for metastability verification of an integrated circuit design are provided. An IC design is received and the source-to-destination paths of the IC design are determined. For each of the determined source-to-destination paths, it is determined whether the corresponding source is synchronized. For each source its respective synchronized or unsynchronized result is stored and a report is generated for each source describing whether it is synchronized or unsynchronized.

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San Jose, CA, United States of America

Namit Gupta