Freescale Semiconductor,inc.

Naman Gupta

Gaurav Goyal

Rohit Goyal

Amol Agarwal

Anurag Jindal

Amit Kumar Dey

Sagar Kataria

Pragya Shukla

Deepak Kumar Behera

An n-bit counter is formed from cascading counter sub-modules. The counter includes combinatorial control logic coupled to a lower-order counter sub-module. The control logic includes a clock-gating integrated cell arranged to clock gate at least one higher-order counter sub-module dependent on a logical combination of outputs of the lower-order counter sub-module and to provide a multi-cycle path for resolution of a logical combination of outputs of any subsequent cascaded counter sub-modules. The control logic does not include any intervening memory device between the lower-order counter sub-module and the clock-gating integrated cell for use in determining a later control logic output.

Low power digital self-gated binary counter

A Gray code counter has multiple two-bit Gray code counter modules, clock gated integrated cells (CGICs), and a parity bit generator. The CGICs gate clock signals provided to the two-bit counter modules, which reduces dynamic power consumption. The parity bit generator generates a parity bit that indicates a count of binary ones in a counting state.

Modular gray code counter

A hybrid counter generates a multi-bit hybrid counter value. The hybrid counter includes two or more asynchronous counters, each configured to generate a subset of the bits of the multi-bit hybrid counter value. The asynchronous counters are interconnected by a logic gate and a clock gating circuit. The logic gate generates an asynchronous logic value based on the bits generated by the previous asynchronous counters. The clock gating circuit re-times the asynchronous logic value to generate a synchronous logic value that is used to toggle the next asynchronous counter. The hybrid counter functions more accurately than conventional asynchronous counters and with less power than conventional synchronous counters.

Hybrid synchronous/asynchronous counter

A method of generating test patterns for testing a semiconductor processor for small delay defects (SDD) includes modifying interconnect delay values of interconnect paths by introducing values corresponding to (i) set-up and clock to Q delays of elements in the paths and (ii) latencies of associated clock networks. Critical nodes are selected and test patterns targeting the selected critical nodes are generated using timing slack resulting from the modified interconnect delays. A first selection of nodes that are critical in at-speed scan mode testing and a second selection of nodes that are critical in functional mode testing are made by static timing analysis (STA). Only the nodes featuring in both the first and second selections are selected for targeting small delay defects using at-speed scan test patterns.

Method of generating test patterns for detecting small delay defects

An n-bit counter is formed from cascading counter sub-modules. The counter includes combinatorial control logic coupled to a lower order counter sub-module. The control logic is arranged to clock gate at least one higher order counter sub-module dependent on a logical combination of outputs of the lower order counter sub-module and where the control logic uses pipelining to store at least one previous control logic output for use in determining a later control logic output.

Digital self-gated binary counter

An adder circuit includes first through fourth two-bit adder modules, and first through third result mux blocks for receiving and adding first and second binary values to generate a final sum. A multiplier circuit that multiplies a multiplier and a multiplicand includes a multiplexer, an encoder connected to the multiplexer, a shifter connected to the encoder, and an accumulator connected to the encoder for receiving the multiplier and multiplicand and generating a multiplication product.

Growing community of inventors

Delhi, India

Naman Gupta