Hitachi Global Storage Technologies Netherlands B.v.

Nalin Zhou

Yu Lo

Hang Fai Ngo

Norman Chu

Patricia Galindo

Shanlin Duan

Bradley Frederick Baumgartner

A glide head calibration technique uses two fly height calibrations on a disk media certifier. The first calibration point uses a spin down on bump technique at a first height, and the second calibration point uses a spin down on disk media roughness at a second lower height. With two height data points, a fly height curve of each glide head is approximated very accurately. Once the fly height curve is derived for each head, any fly height can be dialed-in by the disk media certifier for glide testing. This technique achieves glide fly heights between about 4 nm and 8 nm and does so with improved tolerances.

System, method, and apparatus for glide head calibration with enhanced PZT channel for very low qualification glide heights

A method is presented for glide testing a disk which tests the glide head fly-height by inducing a collision between the glide head and a disk under test. The glide test system is initially calibrated using calibration disks. The method of the invention periodically tests the calibration without interrupting the production testing by lowering the rotation rate until the glide head collides with the rotating disk surface. The rotation rate at which the collision occurs is then compared with the value expected based on knowledge of disk samples and the initial calibration. Parameters for acceptable high and low values are established to detect changes in the glide test system performance to trigger automatic or manual recalibration.

Glide testing of disks with calibration confirmation testing by inducing collision of the slider with production disk surface

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Nalin Zhou