Macronix International Co., Ltd.

Nai Ping Kuo

Chun Hsiung Hung

Ken Hui Chen

Han Sung Chen

Ching Chung Lin

Kuen Long Chang

Yu Chen Wang

Wen Yi Hsieh

A method and apparatus for protecting non-volatile memory is described. A write command is processed only when an operating voltage is between specified operating limits and when a data pattern stored in the non-volatile memory is repeatedly read successfully.

Method and apparatus for protection of non-volatile memory in presence of out-of-specification operating voltage

A virtual ground nitride read-only memory array has a matrix of nitride read-only memory cells in which during an erase operation the non-erasing side of nitride read-only memory cells are connected to a common node for enhancing the erase uniformity of the nitride read-only memory array. If an operation requests erasing on the left side of nitride read-only memory cells, a positive voltage is supplied from an internal power supply to the left side for each of the nitride read-only memory cells, and the right side for each of the nitride read-only memory cells is discharged to a common node. The voltage level of the common mode is selected to be sufficiently high in order to prevent from punch through while at the same time sufficiently low to maintain the lateral electric field for erase operation to function optimally.

Structures and methods for enhancing erase uniformity in a nitride read-only memory array

In accordance with one embodiment of the invention, a memory device comprises an array of memory cells arranged into word lines and bit lines, with a sense amplifier and a plurality of reference cells for each bit line. The sense amplifier for a bit line compares the output of a memory cell for that bit line with the output of one of the plurality of reference cells for that bit line.

Memory device with a plurality of reference cells on a bit line

A virtual ground NROM array has a matrix of NROM cells in which during an erase operation the non-erasing side of NROM cells are connected to a common node for enhancing the erase uniformity of the NROM array. If an operation requests erasing on the left side of NROM cells, a positive voltage is supplied from an internal power supply to the left side for each of the NROM cells, and the right side for each of the NROM cells is discharged to a common node. If an operation requests erasing the right side of NROM cells, a positive voltage is supplied from the internal power supply to the right side for each of the NROM cells, and the right side for each of the NROM cells is connected to the common node. The voltage level of the common mode is selected to be sufficiently high in order to prevent from punch through while at the same time sufficiently low to maintain the lateral electric field for erase operation to function optimally. In an alternative embodiment, non-erasing sides of NROM cells in the NROM array are connected to a current source during an erase operation for enhancing the erase uniformity of the NROM array. If an operation requests erasing the left side of NROM cells, a positive voltage is supplied from an internal power supply to the left side for each of the NROM cells, and the right side for each of the NROM cells is discharged to a current source. If an operation requests erasing the right side of NROM cells, a positive voltage is supplied from the internal power supply to the right side for each of the NROM cells, and the right side for each of the NROM cells is connected to the current source.

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Hsinchu, Taiwan

Nai Ping Kuo