Verizon Patent and Licensing Inc.

Naga Dumpala

Senthil Muthusamy

Abhilash Paul

Adil S Belihomji

Ramasubramanian Radhakkrishnan

Shashidhar Hiremath

Sunil Joshua Alexander Konaiyagarri

Nikhil Kommera

Ning Gao

A device may receive parameters to test modifications to an application associated with a product and/or a service, and may process data identifying the parameters and the application, with a machine learning model, to generate test applications for testing corresponding modifications to the application. The device may define test group sizes of test groups for testing the test applications, and may receive, from user devices, requests for accessing the application. The device may assign, based on the test group sizes, sets of the user devices to the test groups for testing the test applications, and may provide the test applications concurrently to the corresponding sets of the user devices based on the test groups. The device may receive, from the corresponding sets of the user devices, feedback associated with the test applications, and may perform one or more actions based on the feedback.

Systems and methods for generating modified applications for concurrent testing

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Edison, NJ, United States of America

Naga Dumpala