Sandisk Technologies Inc.

Nadav Tsur

Yair Sommer

Avi Shani

Disclosed herein are unitary printed circuit boards (PCBs) and methods of using them for testing an integrated circuit (IC). In some embodiments, a unitary PCB comprises a main board portion and a flexible PCB portion, which are configured to be detached from each other at a separation location on the unitary PCB. The main board portion comprises a plurality of pads, and the flexible PCB portion comprises a plurality of through-holes, where a layout of the through-holes corresponds to a layout of the plurality of pads. In some embodiments, a method of testing an IC of a device comprises separating the unitary PCB into a main board portion and a flexible PCB portion, attaching the IC to the main board portion, soldering the main board portion to a platform PCB of the device, and attaching the flexible PCB portion to the main board portion.

Systems, devices, and methods for testing integrated circuits in their native environments

An integrated circuit (IC) device container/carrier includes a cartridge having a plurality of faces and a device housing slot recessed from one or more of the faces, where each slot is configured to house at least one IC device. The container further includes a lid rotatably coupled with the cartridge, the lid having a window recess configured to align with each device housing slot for accessing corresponding IC devices. At least one of the cartridge faces may be configured as a lock face without a corresponding device housing slot recessed from this lock face.

Growing community of inventors

Bet Herut, Israel

Nadav Tsur