Jasco Corporation

Mutsumi Senuma

Tsutomu Inoue

Yoshihito Narita

Fuminori Sato

Hisashi Masago

Tomoyuki Fukazawa

Atsushi Yamada

Yuji Fujisawa

An optical rotating power measurement method comprising: an optical rotating power data acquisition step of starting measurement of the optical rotating power of the sample in a measurement apparatus during a temperature changing process where a controller controls the temperature of the sample such that the temperature reaches the predetermined temperature and of obtaining temperature data and optical rotating power data of the sample as time passes during the temperature changing process; and a data processing step of obtaining a straight line relationship data between the temperature data and the optical rotating power data, by using the fact that the optical rotating power of the sample is proportional to a measurement temperature; wherein the optical rotating power data of the sample at the predetermined temperature or the temperature dependence data of the optical rotating power of the sample is determined based on the straight line relationship data.

Optical rotating power measurement method and optical rotating power measurement apparatus

A near-field polarized-light measurement apparatuscomprises a near-field probe, an analyzer, a detector, and an analyzer-rotating unit. The near-field probehas at a tip thereof an opening smaller than the wavelength of light used for measurement and generates linearly polarized near-field light from the opening and irradiates a sample with the near-field light. The detectordetects light transmitted through the sample via the analyzer. The analyzer-rotating unitrotates the analyzerabout an optical axis to vary the angle of a transmission axis thereof. And optical rotation of the sample is measured by rotating the analyzerwith the analyzer-rotating unit

Near-field polarized-light measurement apparatus

Growing community of inventors

Hachioji, Japan

Mutsumi Senuma