Istanbul Teknik Üniversitesi

Mustafa Altun

Ismail Cevik

Serzat Safaltin

Sajjad Parvin

A method of perfect detection of concurrent faults in CMOS circuits, using reversible gates and preservative gates is provided. The concurrent faults occurring in the CMOS circuits are detected without being masked by the method. The method includes the following steps: Carrying out functions using the reversible gates and the preservative gates, transforming the reversible gates and the preservative gates into CMOS circuit equivalents.

Perfect detection of concurrent faults in CMOS circuits by exploiting reversible and preservative gates

A four-terminal switch, and a switching lattice comprising four-terminal switches. The four-terminal switch operates and is fabricated according to the principles of complementary metal oxide semiconductor (CMOS) technology. The four-terminal switch includes a bulk layer; a single transistor channel located at a surface of the bulk layer; and four diffusion regions positioned around the single transistor channel. The single transistor channel is a single H shaped transistor channel and the four diffusion regions are positioned around the single H shaped transistor channel.

CMOS compatible device based on four-terminal switching lattices

The invention relates to a device, named four-terminal switch, and a switching lattice comprising four-terminal switches. A four-terminal switch operates and can be fabricated according to the principles of complementary metal oxide semiconductor (CMOS) technology. However, it has four source/drain terminals as opposed to two terminals in conventional MOS devices; it is able to conduct current in two dimensions between four terminals as opposed to one-dimensional current flow in conventional MOS devices; and it is able to form dense switching lattice structures for area efficiency.

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Istanbul, Turkey

Mustafa Altun