Via Technologies, Inc.

Murphy Chen

Perlman Hu

An-Yeu Wu

Meng-Da Yang

Timothy Tseng

The invention provides a new linked structure for a buffer controller and management method thereof. The allocation and release actions of buffer memory can be more effectively processed when the buffer controller processes data packets. The linked structure enables the link node of the first buffer register to point to the last buffer register. The link node of the last buffer register points to the second buffer register. Each of the link nodes of the rest buffers points to the next buffer register in order until the last buffer register. This structure can effectively release the buffer registers in the used linked list to a free list.

Buffer controller and management method thereof

In a method for testing an embedded phase-locked loop (PLL) circuit, a first clock signal is provided to an embedded phase-locked loop (PLL) circuit to be tested. A PLL clock signal of a first frequency is generated by the embedded PLL in response to the first clock signal. The PLL clock signal of the first frequency is sampled with a second clock signal of a second frequency to generate a first sampled signal, wherein the second frequency is different from the first frequency but has a first correlation with the first frequency so that the first sampled signal toggles at a predetermined frequency when the embedded PLL circuit is in a normal operation condition. The embedded PLL circuit is determined to be in an abnormal operation condition if the first sampled signal does not toggle at said predetermined frequency.

Circuit and method for testing embedded phase-locked loop circuit

A predicted parallel branch slicer for use in an adaptive decision feedback equalizer includes Madders commonly receiving a signal to be processed and respectively receiving Mpreset values, and performing respective addition operations to generate Moutput signals; Mslicers in communication with the Madders, receiving and processing the Moutput signals to obtain Msignals of Mlevels, respectively; a multiplexer in communication with the Mslicers, receiving the signals of the Mlevels; and k delay units interconnected with one another in series and being in communication with the multiplexer, and generating k selection signals of different delay time in response to an output of the multiplexer, the selection signals being provided for the multiplexer to select one of the signals of the Mlevels to be outputted.

Predicted parallel branch slicer and slicing method thereof

A method and a device for testing an embedded phase-locked loop (PLL) circuit are disclosed. A first clock signal of a first frequency is provided to an embedded phase-locked loop (PLL) circuit to be tested by a tester, so as to generate a PLL clock signal by the embedded PLL circuit in response to the first clock signal of the first frequency. The PLL clock signal is inputted to a test circuit along with a second clock signal of a second frequency. Then, the PLL clock signal is sampled with the second clock signal of the second frequency to generate a first sampled signal. The second frequency has a first correlation with the first frequency. Whether the embedded PLL circuit is in a normal operation condition is determined according to the first sampled signal.

A controller embeds a volatile memory, a plurality of application circuits and an arbiter. Each of the application circuits is capable of sending a request signal to request access the volatile memory and has a unique priority. When some of the application circuits send requests in a same period, the arbiter selects application circuits with higher priority among those application circuits such that the selected application circuits are allowed to access the volatile memory. The arbiter includes a plurality of arbiter modules and a main arbiter module. Each of the arbiter modules is assigned to a unique set of application circuits in the controller such that the arbiter modules can select higher priority application circuits in the corresponding sets at the same time. The main arbiter module further selects application circuits for accessing the volatile memory according to application circuits selected by the arbiter modules.

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Hsin Tien, Taiwan

Murphy Chen