Nvidia Corporation

Munish Aggarwal

Mahmut Yilmaz

Doochul Shin

Vinod Pagalone

A circuit for improving control over asynchronous signal crossings during circuit scan tests includes multiple scan registers and a decoder configured to translate a combined output of the scan registers into multiple one-hot controls to the local clock gates of scan registers disposed in multiple different clock domains. Programmable registers are provided to selectively enable and disable the local clock gates of the different clock domains.

Growing community of inventors

Santa Clara, CA, United States of America

Munish Aggarwal