Aisin Seiki Kabushiki Kaisha

Munehiro Takayama

Masataka Toda

Yukio Ichikawa

Toshihiko Yoshikawa

Jin Nozawa

Yasuyuki Kuno

Akira Kozakai

Tohru Okada

An inspection device includes: an inspection pattern creating unit that creates an inspection pattern in which first regions each colored with a color different from each other and second regions each colored with a mixed color obtained by mixing at least two of colors with which the first regions are colored are alternately arranged; an irradiation unit that irradiates a surface of an inspection target with the inspection pattern while sliding the inspection pattern by a movement amount; a captured image acquisition unit that acquires a captured image obtained by imaging the surface of the inspection target irradiated with the inspection pattern; and a determination unit that generates color component images obtained by separating the acquired captured image for each of color components of the colors and determines whether or not there is a defect in the surface of the inspection target based on the color component images.

Inspection device

A surface inspection apparatus includes: an inspection pattern forming unit that forms inspection patterns; a projection unit that projects the inspection patterns onto an inspection target object; a captured image acquiring unit that acquires captured images of the inspection target object; an edge extraction image creating unit that extracts edges from captured images, and creates edge extraction images; a correction coefficient setting unit that sets a correction coefficient for correcting intensities of edges in the edge extraction image; an intensity correcting unit that corrects the intensities of the edges; a corrected edge extraction image creating unit that creates corrected edge extraction images; an integrated image creating unit that creates a single integrated image by integrating the brightness values at the same position of the inspection target object; and a determination unit that determines the presence or absence of unevenness on a surface of the inspection target object.

Surface inspection apparatus and surface inspection method

An inspection device includes: an irradiation unit irradiating an inspection target with light by causing a predetermined position within a display screen to emit light; a captured image acquisition unit acquiring a captured image obtained by imaging the inspection target; a calculation unit calculating coordinates in the display screen corresponding to coordinates in the captured image on the basis of light emission position coordinate information and light reception position coordinate information indicating coordinates of a light emission position and a light reception position; and an inspection pattern creation unit creating an inspection pattern which is displayed on the display screen so that first patterns and second patterns are alternately arranged in the captured image and which is used to inspect presence a defect on a surface of the inspection target, on the basis of a calculation result of the calculation unit.

Inspection device, storage medium, and program

An optical scanning apparatus RD scans a laser beam and detects a foregoing vehicle FC present in a forward direction by a reflected beam derived from the laser beam. The apparatus includes a first mode for emitting a narrowed laser beam and a widened laser beam and a second mode for emitting the widened laser beam and the two modes are switched to thereby provide an apparatus for emitting a beam capable of detecting an object in a wide range, causing no detection failure and in compliance with a situation of surrounding objects.

Growing community of inventors

Kariya, Japan

Munehiro Takayama