Skhynix Inc.

Mun Phil Park

Jung Hwan Lee

Chul Moon Jung

Jeong Tae Hwang

Ki Myung Kyung

Kyu Nam Lim

Hong Sok Choi

Sun Hwa Park

Seok Cheol Yoon

Kang Youl Lee

A semiconductor apparatus includes a sense amplifier configured to sense data transmitted through a data line and a sense amplifier control circuit configured to detect whether a level of an external voltage is equal to or larger than an reference voltage level and control a power voltage of the sense amplifier according to a detection result.

Semiconductor apparatus including a sense amplifier control circuit

A semiconductor system may include a command processor configured to decode a command to generate an active pulse and a delayed active pulse, and a bank active signal generation circuit configured to generate a bank active signal for performing an active operation for a bank accessed by an address. The bank active signal may be disabled in synchronization with the active pulse and is enabled in synchronization with the delayed active pulse.

Semiconductor device and semiconductor system

A precharge circuit may include a precharge control unit, a first precharge unit, and a second precharge unit. The precharge control unit may generate a read precharge signal and a write precharge signal in response to a read signal, a write signal, and a precharge signal. The first precharge unit may precharge a data input/output line to a first voltage level in response to the read precharge signal. The second precharge unit may precharge the data input/output line to either a second voltage level or a third voltage level in response to the write precharge signal.

Precharge circuit and semiconductor memory apparatus using the same

An error detecting circuit of a semiconductor apparatus, comprising: a fail detecting section configured to receive 2-bit first test data signals outputted from a first block and 2-bit second test data signals outputted from a second block, disable a first fail detection signal when the 2-bit first test data signals have different levels, disable a second fail detection signal when the 2-bit second test data signals have different levels, and disable both the first and second fail detection signals when the 2-bit first test data signals have the same level, the 2-bit second test data signals have the same level, and levels of the 2-bit first test data signals and the 2-bit second test data signals are the same with each other.

Error detecting circuit and semiconductor apparatus including the same

Various embodiments of a semiconductor memory apparatus are disclosed. In one exemplary embodiment, the semiconductor memory apparatus may include: a column control signal generator configured to generate a column control signal for a pair of bit lines corresponding to a data mask during a data mask operation; and a bit line sense amplifier configured to sense and amplify a voltage difference between the pair of bit lines and electrically couple the pair of bit lines to a pair of segment input/output lines in response to the column control signal.

Semiconductor memory apparatus

A sense amplifier is configured to transfer data on a first data I/O line to a second data I/O line or to transfer data on the second data I/O line to the first data I/O line. The first data I/O line is substantially continuously coupled to the second data I/O line during an active operation.

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Icheon-si, South Korea

Mun Phil Park