Semiconductor Components Industries, LLC

Mukesh Rao Engla Syam

Nicholas Paul Cowley

Andrew David Talbot

An image sensor may include an array of pixels and associated delay calibration circuitry for determining an amount of delay for row control signals. The delay calibration circuitry can include circuitry for generating a calibration row control signal, circuitry for propagating the calibration row control signal down a row of dummy pixels, and one or more sampling circuits coupled to one or more tap points in the row of dummy pixels for monitoring when the calibration row control signal arrives at the one or more tap points. The array of pixels can output signals during normal operation. The image sensor may include column readout circuitry for reading out the signals from the array of pixels. The column readout circuitry can be controlled using sampling signals that are progressively delayed based on count values output from the one or more sampling circuits.

Circuitry and methods for mitigating gradient effects in image sensors

An image sensor may include a pixel array and associated readout paths calibration circuitry. The image sensor may include first column readout circuits formed along a first edge of the pixel array and second column readout circuits formed along a second opposing edge of the pixel array. The readout paths calibration circuitry may include one or more first calibration readout circuits located by the first edge of the array, one or more second calibration readout circuits located by the second edge of the array, and an error detection circuit configured to output an error signal based on signals output from the one or more first calibration readout circuits and the one or more second calibration readout circuits. The one or more second calibration readout circuits and the second column readout circuits can receive a reference voltage that is dynamically adjusted based on the error signal.

Circuitry and methods for mitigating imbalance in image sensors with multiple readout paths

An imaging device may have an array of image sensor pixels arranged in rows and columns and column readout circuitry coupled to the array. The rows of pixels may receive drive signals from row driver circuitry, and the drive signals may be sent from timing circuitry based on the locations of rows within the array. In particular, rows closer to the readout circuitry may require less settling time and therefore be driven faster than the rows further from the readout circuitry. All of the rows may be driven in a single direction, or the array of pixels may have a cut, in which case rows above the cut may be driven up and rows below the cut may be driven down. A frame buffer may be used to store the signals generated by the rows of pixels and may account for the asynchronous read out of image data.

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Bengaluru, India

Mukesh Rao Engla Syam