Contec Corporation

Mrinal Mathur

Samant Kumar

Shivashankar Diddimani

Hemanth Nekkileru

James Christopher Collip

Naresh Chandra Nigam

Rajeev Tiwari

A hardware architecture for a universal testing system used for performing tests on cable modem devices (DUT) is disclosed. According to certain embodiments, a CMTS test harness enables the DUT to respond to test phone calls from the MOCA interface and which test phone calls terminate at the DUT's phone port.

Hardware architecture for universal testing system: cable modem test

A hardware architecture for a universal testing system used for performing Wifi tests on wireless devices under test (DUT) is disclosed. According to certain embodiments, test information travels from a Wifi port of the test server to the Wifi port's antenna in a Faraday cage, and then travels over the air to DUT's Wifi antenna in the same Faraday cage, and then to a LAN Ethernet port of the DUT, and then to the test server's Ethernet port.

Hardware architecture for universal testing system: wireless router test

A system may include a master test system and a plurality of slave test systems coupled to the master test system and/or each other. The system may include devices under test (DUTs) (also referred to herein as units under test (UUTs)) stored in test slots and coupled to the master test system or specific slave test systems over Ethernet, coaxial, or other cables. Each test slot may include a Faraday cage that shields the contents therein from electromagnetic signals outside the test slot. The master test system and/or the slave test systems may test the DUTs using specific sequences of tests according to testing protocols relevant to those DUTs. One or more test controllers, mobile devices, display devices, and/or input devices may be coupled to the test systems and be used to control specific test protocols performed by the test systems.

Systems and methods for testing electronic devices using master-slave test architectures

A universal testing system platform with a modular and symmetrical design that provides a flexible, efficient and space saving architecture for testing wireless devices is disclosed.

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San Jose, CA, United States of America

Mrinal Mathur