Adv Antest Corporation

Motoo Ueda

Satoshi Iwamoto

Masaru Tsuto

Masaru Goishi

Hiroyasu Nakayama

A test apparatus includes: test modules that communicate with the device under test to test the device under test; additional modules connected between the device under test and the test modules, each additional module performing a communication with the device under test, the communication being at least one of a communication performed at a higher speed and a communication performed with a lower latency, in comparison with a communication performed by the test modules; a test head having a plurality of connectors that connect the test modules and the additional modules, respectively, the test modules and the additional modules are mounted on the test head; a performance board placed on the test head that connects between at least a part of terminals of the plurality of connectors and the device under test. The test modules are connected to the additional modules without through the performance board.

Test apparatus additional module and test method

A test apparatus, which is for testing a device under test including a receiving circuit for receiving signals transmitted through a communication cable, includes: a waveform generating section for outputting waveform data to define a waveform to be provided to an input terminal of a receiving circuit; a digital filter having the filter characteristic substantially reverse to the attenuation characteristic of the communication cable, for outputting amplified waveform data obtained by amplifying the waveform data; a DA converter for converting the amplified waveform data to an analog waveform; and a low-pass filter having the attenuation characteristic substantially same as that of the communication cable, for attenuating the analog waveform and providing the same to the receiving circuit.

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Saitama, Japan

Motoo Ueda