Adv Antest Corporation

Other

Motoki Imamura

Shigeki Nishina

Tomoyu Yamashita

Eiji Kato

Akiyoshi Irisawa

Eiji Kimura

Toshio Kawazawa

Kodo Kawase

Takeshi Ozeki

Shiro Ryu

Satoru Nagumo

Fumio Inui

An electromagnetic wave measurement device includes an electromagnetic wave outputter that outputs an electromagnetic wave having a frequency equal to or more than 0.01 THz and equal to or less than 100 THz toward a device under test. An electromagnetic wave detector detects the electromagnetic wave which has transmitted through the device under test. A relative position changer changes a relative position of an intersection of an optical path of the electromagnetic wave transmitting through the device under test and the device under test, with respect to the device under test, so that the intersection is at a predetermined relative position due to the refraction of the electromagnetic wave by the device under test. A characteristic value deriver derives a characteristic value of the electromagnetic wave based on a detection result of the electromagnetic wave detector, the characteristic value being associated with the predetermined relative position.

Electromagnetic wave measuring apparatus, measuring method, program, and recording medium

A carrier includes attachment holes to which a catalyst attaches, and non-attachment holes to which the catalyst does not attach. An attachment quantity measurement device includes an electromagnetic wave output device that outputs a terahertz wave toward the carrier, an electromagnetic wave detector that detects the terahertz wave which has transmitted through the carrier, a reference value obtainer that obtains, based on a result detected by the electromagnetic wave detector, any one of an absorption rate, a group delay, and a dispersion of the terahertz wave in the non-attachment holes, and an attachment quantity obtainer that obtains, based on the result detected by the electromagnetic wave detector and the result obtained by the reference value obtainer, a weight or a density of the catalyst present in the attachment holes.

Carrier and adhesion amount measuring apparatus, and measuring method, program, and recording medium of the same

A detector detects an electromagnetic wave having a frequency of 0.01 THz&#x2266;f&#x2266;100 THz and transmitted through a device under test (DUT). A changer changes a relative position of an intersection of an optical path of the electromagnetic wave and the DUT, with respect to the DUT. A deriver derives a characteristic value of the electromagnetic wave based on a detection result of the detector, while the characteristic value is associated with an assumed relative position, which is the relative position if the electromagnetic wave is not refracted by the DUT. A corrector changes the assumed relative position to an actual relative position, which is the relative position if the refraction of the electromagnetic wave by the DUT is considered. A corrected deriver derives the characteristic value associated with a predetermined relative position based on an output from the corrector.

According to the present invention, an electromagnetic wave measurement device includes an electromagnetic wave output device, an electromagnetic wave detector, a relative position changing unit, a delay period recording unit, a phase deriving unit, a delay-corrected phase deriving unit, a sinogram deriving unit, and an image deriving unit. The electromagnetic wave output device outputs an electromagnetic wave having a frequency equal to or more than 0.01 THz and equal to or less than 100 THz toward a device under test and a container storing at least a part of the device under test.

An object is to enable a change in a frequency for which an electric signal based on an optical signal is measured by a spectrum analyzer. An optical measurement device includes a first photoconductive switch that receives predetermined pulse light from a first laser light source, and outputs terahertz light having the same repetition frequency as the repetition frequency of the predetermined pulse light. The optical measurement device also includes a second photoconductive switch that receives the terahertz light and a sampling light pulse, and outputs a signal corresponding to a power of the terahertz light at a time point when the sampling light pulse is received. The optical measurement device further includes an RF spectrum analyzer that measures a magnitude of the signal corresponding to a measured frequency that changes over time, an optical coupler that outputs a simultaneous light pulse when the predetermined pulse light and the sampling light pulse are simultaneously input, a photo detector that converts the simultaneous light pulse into an electric signal as a trigger signal, and an optical delay circuit that delays the trigger signal.

Optical measuring apparatus

The present invention precisely measures characteristic values (such as the absorption coefficient) of an electromagnetic wave when a density of a PM in a DPF which collects the PM in an exhaust gas. The DPF receives the exhaust gas, and collects the PM in the exhaust gas. The DPF includes first hole portions which are open at a first end on a side for receiving the exhaust gas, and are closed at a second end on a side opposite to the first end, second hole portions which are closed at the first end and are open at the second end, and third hole portions which are closed at the first end. The first hole portion and the second hole portion are adjacent to each other. The third hole portions are adjacent to each other. The PM in the exhaust gas passing through partition walls which partition the first hole portion and the second hole portion adjacent to each other is collected by the partition walls.

Collection medium and collection amount measuring apparatus, and measuring method, program, and recording medium of the same

According to the present invention, the CT is carried out based on parameters other than the absorption rate. An electromagnetic wave measurement device includes an electromagnetic wave output devicewhich outputs an electromagnetic wave at a frequency equal to or more than 0.01 [THz] and equal to or less than 100 [THz] toward a device under test, an electromagnetic wave detectorwhich detects the electromagnetic wave which has transmitted through the device under test, a relative position changing unitwhich changes a relative position of an intersectionat which an optical path of the electromagnetic wave transmitting through the device under testand the device under testintersect with respect to the device under test, a phase deriving unitwhich derives, based on a detected result by the electromagnetic wave detector, a phase in the frequency domain of the electromagnetic wave which has transmitted through the device under test, a sinogram deriving unitwhich derives a sinogram based on a derived result by the phase deriving unit, and a cross sectional image deriving unitthat derives, based on the sinogram, an image of a cross section of the device under testincluding a trajectory of the intersection

Electromagnetic wave measuring apparatus, measurement method, a program, and a recording medium

A desired spatial resolution upon a measurement can be attained by making an electromagnetic wave including a terahertz wave (frequency thereof is equal to or more than 0.01 [THz], and equal to or less than 100 [THz]) incident to a device under test. An electromagnetic wave measurement device includes an incident lens which makes an electromagnetic wave to be measured having a frequency equal to or more than 0.01 [THz] and equal to or less than 100 [THz] incident to a device under a test while decreasing a beam diameter of the electromagnetic wave to be measured, a scanning stage which rotates, about a line orthogonal to an optical axis of the incident lens as a rotational axis, the device under the test or the optical axis, and an electromagnetic wave detector which detects the electromagnetic wave to be measured which has transmitted through the device under the test, where a coordinate on the optical axis of a position which gives the minimum value d of the beam diameter is different from a coordinate on the optical axis of the rotational axis.

Electromagnetic wave measuring apparatus

A device for measuring &#x3c4;includes a polarization controller () that allows first (second) incident light, in a synthetic incident light to an object to be measured (), to be in line with a p-polarization (s-polarization) axis in a polarization separator (). The phase shift equivalent value (optical angle frequency differentiation) and amplitude equivalent value (square value) of a first (second) incident light component in an output from the polarization separator () measured by a first (second) measuring unit () are respectively the phase shift equivalent value and amplitude equivalent value of a first column T, T(second column T, T) when the transfer function matrix of the object () is a 2&#xd7;2 matrix to thereby allow a control unit () to determine the polarization mode dispersion &#x3c4;of the object ().

Polarization mode dispersion measuring device, method, recording medium

An apparatus capable of reducing a waveform distortion of outgoing light when light of an optical wavelength in a certain specific narrow range is incident upon optical fiber comprises optical source for supplying the incident light to optical fiber line , waveform monitor for measuring a waveform distortion of the transmitted light and adjusting unit for adjusting an output of the incident light so that the measured waveform distortion falls within a predetermined range. By adjusting the output of the incident light, a S/N ration is lowered. Since the noise exists within a relatively wide range of wavelength, the rang of wavelength of the incident light is widened. Therefore, it is possible to reduce the waveform distortion of the outgoing light.

Optical characteristic measuring apparatus, the method thereof and recording medium

A technique for measuring optical characteristics includes providing a variable wavelength light source a fixed wavelength light source optical modulators for modulating the variable wavelength light and the fixed wavelength light, a fiber coupler for entering composite light generated by composing the variable wavelength light with the fixed wavelength light into a device under test, a circulator for extracting a variable wavelength light component from light transmitted through a fiber pair, and an optical filter for extracting a variable wavelength light component from the transmitted light, and measuring a phase difference of the variable wavelength light component with the fixed wavelength light component as a reference.

Apparatus and method for measuring optical characteristics and recording medium

An apparatus for measuring optical characteristics includes a variable-wavelength light source for generating a variable-wavelength light, having an identification waveform when the wavelength changes, the identification waveform being distinguishable from a normal waveform before and after the wavelength changes, an optical modulator for modulating the variable-wavelength light at a predetermined frequency and inputting it to an optical fiber; and an identification waveform detector for detecting the identification waveform of light transmitted through the optical fiber, wherein since the identification waveform detector detects when the waveform starts to change, it is possible to obtain synchronization between an incidence side and an exit side of the optical fiber. Accordingly, it is possible to obtain synchronization between an incidence side and an exit side of a device-under-test even if the wavelength of light source is continuously swept, whereby characteristics such as chromatic dispersion and the like can be measured.

There are provided an optical transfer characteristic measuring method and apparatus capable of measuring an optical transfer characteristic of an optical device on optical frequency axis in wide optical frequency bandwidth with high resolution. There are provided a variable wavelength sweep type light source capable of switching the wavelength of an optical signal generated therefrom stepwise and sweeping the optical frequency of the optical signal in a predetermined frequency range, and a variable wavelength reference light source capable of switching the wavelength of an optical signal generated therefrom stepwise and not capable of sweeping the optical frequency of the optical signal. Optical signals having their wavelengths sequentially switched to corresponding specified wavelengths are generated from the variable wavelength sweep type light source, and also a sweep of the optical frequency of each optical signal having the corresponding specified wavelength is carried out over the predetermined frequency range, until the number of occurrences of the optical signals reaches a preset number of times. After the measurement of the optical transfer characteristic has been completed, the measured results of the optical transfer characteristic regarding all of the specified wavelengths are concatenated on optical frequency axis, and is analyzed/displayed.

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Miyagi, Japan

Motoki Imamura