Tokyo Electron Limited

Motokatsu Miyazaki

Kazushi Shoji

Noriaki Koyama

Nobutoshi Terasawa

Shintaro Saruwatari

An information processing apparatus detects an abnormality sign in a semiconductor manufacturing apparatus. The apparatus includes: a sensor data collector configured to acquire sensor waveform data represented with respect to a sensor value axis and a time axis measured by a semiconductor manufacturing apparatus that is executing a process according to a same recipe; a monitoring band calculator configured to calculate each monitoring band represented with respect to the sensor value axis and the time axis used in a waveform monitoring method from a predetermined number or more of the sensor waveform data; and an abnormality sign detector configured to monitor a waveform of the sensor waveform data using each monitoring band represented with respect to the sensor value axis and the time axis and detect an abnormality sign of the semiconductor manufacturing apparatus.

Method and apparatus for determining cause of abnormality in a semiconductor manufacturing chamber

A semiconductor system shares information on a semiconductor manufacturing apparatus between first and second semiconductor manufacturing apparatuses through direct communication. The first semiconductor manufacturing apparatus includes a first acquisition unit acquiring first information on the first semiconductor manufacturing apparatus, a first storage unit storing the acquired first information, and a first communication unit sending the stored first information to the second semiconductor manufacturing apparatus. The second semiconductor manufacturing apparatus includes a second acquisition unit acquiring second information on the second semiconductor manufacturing apparatus, a second storage unit storing the acquired second information, a second communication unit receiving the first information sent from the first semiconductor manufacturing apparatus, an analysis unit analyzing a state of the second semiconductor manufacturing apparatus based on the received first information and the stored second information, an information generation unit generating information visualizing an analysis result, and a display unit displaying the generated information.

Semiconductor system

Disclosed is an abnormality detection apparatus including: a collection unit that collects state information indicating a state of each part of a semiconductor manufacturing apparatus in a predetermined cycle; a storage unit that stores the state information collected by the collection unit as a log for each predetermined unit; an arithmetic unit that generates a monitoring band for monitoring the state of each part of the semiconductor manufacturing apparatus, based on the log; and a determination unit that determines whether the state of each part of the semiconductor manufacturing apparatus is abnormal, based on the state information and the monitoring band.

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Sapporo, Japan

Motokatsu Miyazaki