Sri International

Motilal Agrawal

David S Stoker

Cregg Cowan

John Brian Burns

Jan E Van Der Laan

Erik Frank Matlin

Neil William Troy

James R Potthast

A method and apparatus for scanning an integrated circuit comprising a plurality of time-synchronized laser microscopes, each of which is configured to scan the same field of view of an integrated circuit under test that generates a plurality of images of the integrated circuit under test, a data processor, coupled to the laser scanning microscope, for processing the plurality of images, comprising, a netlist extractor (NE) that produces one or more netlists defining structure of the integrated circuit under test.

Method and apparatus for conducting automated integrated circuit analysis

The present invention relates to a method and apparatus for long-range facial and ocular acquisition. One embodiment of a system for acquiring an image of a subject's facial feature(s) includes a steerable telescope configured to acquire the image of the facial feature(s), a first computational imaging element configured to minimize the effect of defocus in the image of the facial feature(s), and a second computational imaging element configured to minimize the effects of motion blur. In one embodiment, the detecting, the acquiring, the minimizing the effect of the motion, and the minimizing the effect of the defocus are performed automatically without a human input.

Method and apparatus for automatically acquiring facial, ocular, and iris images from moving subjects at long-range

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San Carlos, CA, United States of America

Motilal Agrawal