Raytheon Company

Delaware Corporation

Moshe Mazin

Edward T Lewis

Jun-ichi Sano

Dennis A Henlin

Lance A Glasser

James E Meister

M Halberstam

A content limit addressable memory (CLAM) having a plurality of lower and upper limits stored therein for comparison to corresponding subfields of an input word. Each corresponding upper and lower limit forms a bracket. Corresponding brackets form a window. The brackets correspond to the subfields and are of the same number of bits. The brackets and subfields are alterable in width to allow each bracket and subfield to have any number of bits in multiples of two. A valid match of the input word with any window can occur with any combination of the brackets of a window matching or not matching the corresponding subfields of the input word. A plurality of outputs corresponding to each of the windows indicates a match of the corresponding window to the input word. Additionally, the CLAM can compare data stored therein against an applied window with the matching operations as described above.

Content limit addressable memory

An integrated circuit memory having a plurality of row lines; a plurality of select lines; a plurality of output lines; a plurality of memory cells; each pair of memory cells having common outputs coupled to a select one of the plurality of output lines and common address inputs coupled to a select one of the plurality of row lines, wherein ambiguity of which memory cell of the pair of memory cells to be selected, being coupled to a select one of the plurality of row lines and a select one of the plurality of output lines, is determined by two selected ones of the plurality of select lines coupled thereto. Also provided is a first decoder, responsive to an input address, for enabling a select one of the plurality of row lines, and a second decoder, responsive to the row lines and to the input address, for enabling a select one of the select lines which corresponds to pairs of memory cells with an enabled row line.

High density read-only memory

A high speed full adder circuit is shown to include logic circuitry responsive to the levels of the two digital signals to be added for: (a) immediately producing an appropriate carry signal when the levels of the digital signals are the same; and (b) inverting the carry signal into such adder when the levels of the digital signals differ.

High speed full adder

A multibit digital adder wherein a proper carry-out signal is generated simultaneously in different parts of such adder.

Conditional carry adder for a multibit digital computer

A multibit digital adder is shown wherein a pair of carry generating circuitries is disposed between single adders for each bit in the digital numbers to be added, each one of such carry generating circuitries being responsive to a different carry-in signal and to the level of the bits applied to the associated single bit adder to produce the proper carry-in signal to the following single bit adder.

Conditional-carry adder for multibit digital computer

A non-volatile integrated circuit memory is provided having an array of memory elements selectively programmable to store complimentary binary data, each one of such memory elements being formed in a different region of the integrated circuit and having an address terminal, an output terminal, a ground terminal, and a power supply terminal. Those memory cells programmed into a first logical state are provided with transistor action between the output terminal and the power supply terminal and are inhibited from having transistor action between the output terminal and the ground terminal. Conversely, those memory cells programmed to store the complementary logic state are inhibited from having transistor action between the output terminal and the power supply terminal and are provided with transistor action between the ground terminal and the output terminal. In either programmed state, the transistor action is controlled by signals fed to the address terminal of the cells. With such arrangement, since transistor action is prevented between the power supply terminal and the ground terminal of each cell, an electrical open-circuit is always present to the power supply with the result that a precharge cycle is not required during memory addressing to reduce power. The elimination of such pre-charge cycle thereby eliminates the time delays inherent with the precharge cycle circuitry to thereby increase the operating speed of the memory and, further, the elimination of the circuitry increases the storage capacity of the ROM by making more chip area available for memory cells.

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Andover, MA, United States of America

Moshe Mazin