Applied Materials Israel Limited

Vayavision Sensing, Ltd.

Moshe Langer

Youval Nehmadi

Ronny Cohen

Ron Naftali

Haim Feldman

Silviu Reinhorn

Roman Kris

Shmuel Mangan

Dan Grossman

Zvi Nezer

Yoram Uziel

Ehud Tirosh

Mark Wagner

Ofer Adan

Ori Shoval

Ram Peltinov

A method for performing active distance measurements, the method may include receiving or generating an identification of at least one target object recognized in an image; emitting, by a transmission module, one or more light pulses towards the at least one target object; directing, by an optical multiplexer of a reception module, towards at least one detector, at least one reflected light pulse that is reflected from the at least one target object; detecting, by at least one detector of the reception module, the at least one reflected light pulse; dynamically coupling, by an electrical multiplexer, the at least one detector to at least one distance measurement unit; calculating, by the one or more distance measurement units, a distance to each one of the at least one target object based on the at least one emitted light pulse and the at least one reflected light pulse.

System and method for performing active distance measurements

A method for managing a change in a physical property of a vehicle due to an external object that is attached to the vehicle, the method may include receiving information regarding the external object and a relationship between the external object and the vehicle; wherein at least part of the information is sensed information that is sensed by a sensor; determining, by a vehicle computer and based on the information, an effect of the external object on the vehicle; and responding to the effect of the external object on the vehicle.

Managing a change in a physical property of a vehicle due to an external object

A method, a system and a computer readable medium are provided. The method may include obtaining or receiving first area information representative of a first area of a first layer of an inspected object; wherein the inspected object further comprises a second layer that comprises a second area; wherein the second layer is buried under the first layer; directing electrons of a primary electron beam to interact with the first area; directing electrons of the primary electron beam to interact with the second area; generating detection signals responsive to electrons that were scattered or reflected from at least one of the first and second areas; and determining at least one spatial relationship between at least one feature of the first area and at least one feature of the second area based on the detection signals and on the first area information.

High electron energy based overlay error measurement methods and systems

A method for inspecting a region, including irradiating the region via an optical system with a pump beam at a pump wavelength. A probe beam at a probe wavelength irradiates the region so as to generate returning probe beam radiation from the region. The beams are scanned across the region at a scan rate. A detector receives the returning probe radiation, and forms an image of the region that corresponds to a resolution better than pump and probe Abbe limits of the optical system. Roles of the pump and probe beams may be alternated, and a modulation frequency of the pump beam may be changed, to produce more information. Information extracted from the probe signal can also differentiate between different materials on the region.

High resolution wafer inspection system

A method and system for defect localization including (i) receiving a test structure that includes at least one conductor that is at least partially covered by an electro-optically active material; (ii) providing an electrical signal to the conductor, so as to charge at least a portion of the conductor; and (iii) imaging the test structure to locate a defect.

Probe card and a method for detecting defects using a probe card and an additional inspection

Growing community of inventors

Nes Ziona, Israel

Moshe Langer